IP Library Granted Patent US 7,306,969
Granted Patent B2
US 7,306,969 · App. 11/187,552 · Granted Dec 11, 2007

Methods to minimize contact resistance

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Quick Facts
Patent No.
US 7,306,969
App. No.
11/187,552
Granted
Dec 11, 2007
Kind
B2
Abstract

A method is disclosed for making a metal electrode which minimizes the contact resistance between it and an organic semiconductor. Acid-stabilized metal nanoparticles are deposited upon a substrate and annealed. This creates a metal electrode and releases acid. Upon deposition of semiconductor and subsequent annealing, the acid diffuses from the electrode into the semiconductor layer and acts as a dopant, minimizing the contact resistance. The use of oleic acid-stabilized silver nanoparticles is demonstrated.

Claims (20)

1. A method for making an electronic device comprising:

providing acid-stabilized metal nanoparticles and a substrate which may optionally include a gate electrode and/or a dielectric layer;

depositing the acid-stabilized metal nanoparticles, followed by annealing to form one or more metal electrodes;

depositing a semiconductor layer with an optional annealing, wherein no or minimum contact resistance exist between the metal electrodes and the semiconductor layer.

2. The method of claim 1 , wherein the acid-stabilized metal nanoparticles are acid-stabilized silver nanoparticles.

3. The method of claim 1 , wherein the acid-stabilized metal nanoparticles are oleic acid-stabilized metal nanoparticles.

4. The method of claim 1 , wherein acid-stabilized metal nanoparticles are oleic acid-stabilized silver nanoparticles.

5. The method of claim 1 , wherein the step of providing acid-stabilized metal nanoparticles is performed by providing a mixture of acid-stabilized metal nanoparticles comprising different metals and/or different acids.

6. The method of claim 1 , wherein the acid of the acid-stabilized metal nanoparticles is selected from the group of organic acids containing from about 2 to about 30 carbon atoms.

7. The method of claim 1 , wherein the metal of the acid-stabilized metal nanoparticles is selected from the group consisting of silver, gold, platinum, copper, cobalt, indium, and nickel.

8. The method of claim 1 , wherein the step of depositing acid-stabilized metal nanoparticles is performed by a deposition method selected from the group consisting of printing, spraying, stamping, spinning-on, and dipping.

9. The method of claim 1 , wherein the step of depositing acid-stabilized metal nanoparticles is performed by:

depositing a dispersion comprising of acid-stabilized metal nanoparticles and a liquid; and

drying the deposited acid-stabilized metal nanoparticle features to remove the liquid and leave the acid-stabilized metal nanoparticles in the features.

10. The method of claim 1 , wherein the step of forming at least one metal electrode and releasing acid or chemically reacted acid is performed by annealing the acid-stabilized metal nanoparticle features to form at least one electrically conductive metal electrode and release acid or chemically reacted acid.

11. The method of claim 10 , wherein the annealing is performed at a temperature of from about 50° C. to about 250° C. for a period of from about 1 minute to about 120 minutes.

12. The method of claim 1 , wherein the step of depositing the semiconductor layer is prior to the step of depositing of the acid-stabilized metal nanoparticles.

13. The method of claim 1 , wherein the step of optional annealing the deposited acid-stabilized nanoparticles and the semiconductor layer is performed by annealing at a temperature of from about 50° C. to about 250° C. for a period of from about 5 minutes to about 120 minutes.

14. The method of claim 1 , wherein the acid or chemically reacted acid from the acid-stabilized metal nanoparticles diffuses into the semiconductor layer and forms a contact region, which eliminates or minimizes the contact resistance.

15. The electronic device produced by the method of claim 1 .

Assignments (10)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2025
From: XEROX CORPORATION
To: GENESEE VALLEY INNOVATIONS, LLC
Reel/Frame 073842/0479 →
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
RELEASE OF SECURITY INTEREST IN PATENTS AT R/F 062740/0214 Recorded May 18, 2023
From: CITIBANK, N.A., AS AGENT
To: XEROX CORPORATION
Reel/Frame 063694/0122 →
SECURITY INTEREST Recorded Nov 10, 2022
From: XEROX CORPORATION
To: CITIBANK, N.A., AS AGENT
Reel/Frame 062740/0214 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 22, 2005
From: WU, YILIANG; ONG, BENG S.; LI, YUNING
To: XEROX CORPORATION
Reel/Frame 016813/0855 →