Method and device for measuring reflected optical radiation
View Patent ↗The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source to the sampling area on the assay matrix and to direct the radiation diffusely reflected from the sampling area to the detector. The optics assembly is positioned over the face of the circuit board having the optical radiation source and detector mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrixes.
1. An optical system for use in an assay strip meter, comprising:
a support;
at least one optical radiation emitter mounted on the support;
at least one detector mounted on the support, wherein the at least one optical radiation emitter and the at least one detector are co-planar with one another; and
an optical assembly positioned on the support, wherein the optical assembly has optical pathways configured to direct light from the at least one optical radiation emitter to at least one assay strip, and to direct light from the at least one assay strip to the at least one detector wherein the optical assembly is formed from an integral block of material and the optical pathways formed by the shape of the block comprise totally internal reflecting elements.