Method for producing semiconductor chips using thin film technology, and semiconductor chip using thin film technology
View Patent ↗For semiconductor chips ( 1 ) using thin film technology, an active layer sequence ( 20 ) is applied to a growth substrate ( 3 ), on which a reflective electrically conductive contact material layer ( 40 ) is then formed. The active layer sequence is patterned to form active layer stacks ( 2 ), and reflective electrically conductive contact material layer ( 40 ) is patterned to be located on each active layer stack ( 2 ). Then, a flexible, electrically conductive foil ( 6 ) is applied to the contact material layers as an auxiliary carrier layer, and the growth substrate is removed.
1. A thin film semiconductor chip, comprising:
an active layer stack configured to generate electromagnetic radiation;
an electrically conductive reflective contact material layer disposed on the active layer stack; and
a carrier layer, wherein the carrier layer is a prefabricated flexible electrically conductive foil disposed on the electrically conductive reflective contact material layer, said flexible electrically conductive foil having a thickness of less than 100 μm and being joined to the active layer stack.
2. The thin film semiconductor chip as claimed in claim 1 , wherein the electrically conductive foil is a carbon foil.
3. The thin film semiconductor chip as claimed in claim 1 , wherein the electrically conductive reflective contact material layer comprises a metallic material.
4. The thin film semiconductor chip as claimed in claim 1 , wherein an electrically conductive reinforcing layer is disposed between the carrier layer and the contact material layer.
5. The thin film semiconductor chip as claimed in claim 4 , wherein the electrically conductive reinforcing layer comprises a metallic material.
6. The thin film semiconductor chip as claimed in claim 1 , wherein side faces of the thin film semiconductor chips at least partially comprise a passivation layer.
7. The thin film semiconductor chip as claimed in claim 1 , wherein side faces of the thin film semiconductor chips comprise a passivation layer over their entire area.
8. The thin film semiconductor chip as claimed in claim 1 , having a total thickness of less than 150 μm.
9. The thin film semiconductor chip as claimed in claim 1 , having a total thickness of less than 100 μm.
10. The thin film semiconductor chip as claimed in claim 2 , wherein the carbon foil has a thickness of 30 to 80 μm.
11. A thin film semiconductor chip comprising:
an active layer stack configured for generating electromagnetic radiation;
an electrically conductive reflective contact material layer disposed on the active layer stack; and
a carrier layer, wherein the carrier layer is a prefabricated flexible electrically conductive foil disposed on the electrically conductive reflective contact material layer;
wherein the thin film semiconductor chip has a total thickness of less than 100 μm.
12. The thin film semiconductor chip of claim 11 , wherein the flexible electrically conductive foil adjoins the electrically conductive reflective contact material layer on a side of the electrically conductive reflective contact material layer which is remote from the active layer stack.