IP Library Granted Patent US 8,461,628
Granted Patent B2
US 8,461,628 · App. 11/203,563 · Granted Jun 11, 2013

MOS transistor with laser-patterned metal gate, and method for making the same

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Quick Facts
Patent No.
US 8,461,628
App. No.
11/203,563
Granted
Jun 11, 2013
Kind
B2
Abstract

A MOS transistor with a laser-patterned metal gate, and methods for its manufacture. The method generally includes forming a layer of metal-containing material on a dielectric film, wherein the dielectric film is on an electrically functional substrate comprising an inorganic semiconductor; laser patterning a metal gate from the metal-containing material layer; and forming source and drain terminals in the inorganic semiconductor in locations adjacent to the metal gate. The transistor generally includes an electrically functional substrate; a dielectric film on at least portions of the electrically functional substrate; a laser patterned metal gate on the dielectric film; and source and drain terminals comprising a doped inorganic semiconductor layer adjacent to the metal gate. The present invention advantageously provides MOS thin film transistors having reliable electrical characteristics quickly, efficiently, and/or at a low cost by eliminating one or more conventional photolithographic steps.

Claims (56)

1. An electronic device, comprising:

a) a substrate;

b) a semiconductor layer on the substrate;

c) a dielectric film on at least portions of said substrate and/or said semiconductor layer;

d) a laser written metal gate on the dielectric film; and

e) source and drain terminals comprising a doped layer on or in said semiconductor layer, substantially adjacent to said laser written metal gate, wherein each of said source and drain terminals has a border closest to said laser written metal gate that is substantially aligned with a border of said laser written metal gate.

2. The electronic device of claim 1 , further comprising (i) one or more first conductors electrically connected to each of said source and drain terminals and (ii) a second conductor electrically connected to said laser written metal gate.

3. The electronic device of claim 2 , wherein said second conductor comprises at least one conductive and/or barrier layer, and said second conductor contacts a landing pad region of the laser written metal gate.

4. The electronic device of claim 3 , wherein said landing pad region has a width of from 1.25 to 4 times a width of said laser written metal gate.

5. The electronic device of claim 2 , further comprising a second dielectric and/or a passivation layer over said first and second conductors and said laser written metal gate.

6. The electronic device of claim 1 , wherein said substrate and said semiconductor layer comprise an electrically inert substrate and a transistor channel layer thereon.

7. The electronic device of claim 6 , wherein said transistor channel layer comprises a lightly doped semiconductor.

8. The electronic device of claim 1 , wherein said doped layer comprises an electrically active, polycrystalline Group IVA semiconductor layer.

9. The electronic device of claim 1 , wherein said dielectric film has a thickness of from 20 Å to 400 Å.

10. The electronic device of claim 1 , wherein said laser written metal gate has a width greater than a width of said dielectric film.

11. The electronic device of claim 1 , wherein said laser written metal gate has a width of at least 2 microns.

12. The electronic device of claim 1 , wherein said laser written metal gate has a width of at least 5 microns.

13. The electronic device of claim 1 , wherein said laser written metal gate consists essentially of a metal or a metal alloy.

14. The electronic device of claim 13 , wherein said laser written metal gate consists essentially of cured and/or annealed metal nanoparticles.

15. The electronic device of claim 1 , wherein said laser written metal gate has a thickness of from 50 nm to 5000 nm.

16. The electronic device of claim 1 , wherein said source and drain terminals comprise a heavily doped semiconductor layer.

17. The electronic device of claim 1 , wherein said dielectric film has a thickness greater than a thickness of said source and drain terminals.

18. The electronic device of claim 1 , wherein said substrate comprises a glass plate, a ceramic plate or disc, a plastic sheet or disc, metal foil, a metal sheet or disc, or a laminated or layered combination thereof.

19. The electronic device of claim 18 , wherein said substrate comprises said metal foil and a barrier layer directly thereon.

20. The electronic device of claim 18 , wherein said substrate comprises said metal foil and said dielectric layer directly thereon.

21. The electronic device of claim 1 , wherein said laser written metal gate comprises a cured and/or annealed metal precursor, said metal precursor comprising at least one photodefinable metal-containing species.

22. The electronic device of claim 1 , wherein said laser written metal gate comprises a directly irradiated metal precursor.

23. The electronic device of claim 1 , wherein said laser written metal gate is formed by a process comprising directly irradiating a portion of a metal precursor and removing non-irradiated portions of said metal precursor with a developer.

24. An electronic device, comprising:

a) a substrate;

b) a semiconductor layer on the substrate;

c) a dielectric film on at least portions of said substrate and/or said semiconductor layer;

d) a laser written metal gate on the dielectric film, said metal gate having a width of at least 2 microns; and

e) source and drain terminals comprising a doped layer on or in said semiconductor layer, substantially adjacent to said laser written metal gate.

25. The electronic device of claim 24 , wherein each of said source and drain terminals has a border closest to said laser written metal gate that is substantially aligned with a border of said laser written metal gate.

26. The electronic device of claim 24 , further comprising (i) one or more first conductors electrically connected to each of said source and drain terminals and (ii) a second conductor electrically connected to said laser written gate.

27. The electronic device of claim 26 , wherein said second conductor comprises at least one conductive and/or barrier layer, and said second conductor contacts a landing pad region of the laser written metal gate.

28. The electronic device of claim 27 , wherein said landing pad region has a width of from 1.25 to 4 times a width of said laser written metal gate.

29. The electronic device of claim 26 , further comprising a second dielectric and/or a passivation layer over said first and second conductors and said laser written metal gate.

30. The electronic device of claim 24 , wherein said substrate and said semiconductor layer comprise an electrically inert substrate and a transistor channel layer thereon.

31. The electronic device of claim 30 , wherein said transistor channel layer comprises a lightly doped semiconductor.

32. The electronic device of claim 24 , wherein said doped layer comprises an electrically active, polycrystalline Group IVA semiconductor layer.

33. The electronic device of claim 24 , wherein said dielectric film has a thickness of from 20 Å to 400 Å.

34. The electronic device of claim 24 , wherein said laser written metal gate has a width greater than a width of said dielectric film.

35. The electronic device of claim 24 , wherein said laser written metal gate has a width of at least 5 microns.

36. The electronic device of claim 24 , wherein said laser written metal gate consists essentially of a metal or a metal alloy.

37. The electronic device of claim 36 , wherein said laser written metal gate consists essentially of cured and/or annealed metal nanoparticles.

38. The electronic device of claim 24 , wherein said laser written metal gate has a thickness of from 50 nm to 5000 nm.

39. The electronic device of claim 24 , wherein said source and drain terminals comprise a heavily doped semiconductor layer.

40. The electronic device of claim 24 , wherein said dielectric film has a thickness greater than a thickness of said source and drain terminals.

41. The electronic device of claim 24 , wherein said substrate comprises a glass plate, a ceramic plate or disc, a plastic sheet or disc, metal foil, a metal sheet or disc, or a laminated or layered combination thereof

42. The electronic device of claim 41 , wherein said substrate comprises said metal foil and a barrier layer thereon.

43. The electronic device of claim 41 , wherein said substrate comprises said metal foil and said dielectric layer thereon.

44. The electronic device of claim 24 , wherein said laser written metal gate comprises a cured and/or annealed metal precursor, said metal precursor comprising at least one photodefinable metal-containing species.

45. The electronic device of claim 24 , wherein said laser written metal gate comprises a directly irradiated metal precursor.

46. The electronic device of claim 24 , wherein said laser written metal gate is formed by a process comprising directly irradiating a portion of a metal precursor and removing non-irradiated portions of said metal precursor with a developer.

Assignments (5)
CHANGE OF NAME Recorded Aug 22, 2022
From: THIN FILM ELECTRONICS ASA
To: ENSURGE MICROPOWER ASA
Reel/Frame 061298/0249 →
SECURITY INTEREST Recorded Jun 9, 2020
From: THIN FILM ELECTRONICS, INC.; THIN FILM ELECTRONICS, ASA
To: UTICA LEASECO, LLC
Reel/Frame 053472/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2014
From: KOVIO, INC.
To: THIN FILM ELECTRONICS ASA
Reel/Frame 032126/0931 →
SECURITY AGREEMENT Recorded Jun 27, 2013
From: KOVIO, INC.
To: SQUARE 1 BANK
Reel/Frame 030706/0282 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2005
From: CHOI, CRISWELL; ROCKENBERGER, JOERG; MACKENZIE, J. DEVIN; GUDEMAN, CHRISTOPHER
To: KOVIO, INC.
Reel/Frame 016811/0512 →