IP Library Granted Patent US 7,176,053
Granted Patent B1
US 7,176,053 · App. 11/204,724 · Granted Feb 13, 2007

Laser ablation method for fabricating high performance organic devices

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,176,053
App. No.
11/204,724
Granted
Feb 13, 2007
Kind
B1
Abstract

A laser ablation method is utilized to define the channel length of an organic transistor. A substrate is coated with a deposition of a metal or conductive polymer deposition, applied in a thin layer in order to enhance the resolution that can be attained by laser ablation. The laser ablation method can be used in a roll-to-roll process, and achieves speeds, volumes, prices and resolutions that are adequate to produce printed electronic technologies.

Claims (41)

1. A method of forming an organic transistor comprising using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length, and to simultaneously pattern a plurality of transistors and a printed antenna in an RFID circuit.

2. A method of forming an organic transistor comprising using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length, and to simultaneously pattern a plurality of transistors in an RFID circuit.

3. The method of claim 2 wherein the ablation resolution is between 2 μm and 4 μm.

4. The method of claim 2 , further comprising forming a top gate organic transistor structure.

5. The method of claim 2 , further comprising forming a bottom gate, top contact organic transistor structure.

6. The method of claim 2 , further comprising forming a bottom gate, bottom contact organic transistor structure.

7. A method of forming an organic transistor comprising using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length, and to simultaneously pattern a plurality of transistors and printed antennas in a plurality of RFID circuits.

8. The method of claim 7 wherein the ablation resolution is between 2 μm and 4 μm.

9. The method of claim 7 , further comprising forming a top gate organic transistor structure.

10. The method of claim 7 , further comprising forming a bottom gate, top contact organic transistor structure.

11. The method of claim 7 , further comprising forming a bottom gate, bottom contact organic transistor structure.

12. A method of forming an organic transistor comprising using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length, and to simultaneously pattern a plurality of transistors in a plurality of RFID circuits.

13. The method of claim 12 wherein the ablation resolution is between 2 μm and 4 μm.

14. The method of claim 12 , further comprising forming a top gate organic transistor structure.

15. The method of claim 12 , further comprising forming a bottom gate, top contact organic transistor structure.

16. The method of claim 12 , further comprising forming a bottom gate, bottom contact organic transistor structure.

17. A method of forming an organic transistor comprising using multiple exposures of laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length.

18. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

depositing a single column of metal rectangles where an RFID circuit is to be formed, and sequentially ablating each metal rectangle.

19. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length;

depositing a plurality of columns of metal rectangles where a plurality of RFID circuits are to be formed;

simultaneously ablating a row of metal rectangles; and

simultaneously ablating sequential rows of metal rectangles.

20. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

using multiple laser heads to simultaneously expose a plurality of RFID circuits.

21. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

using a single laser head to expose a single RFID circuit.

22. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

forming a stopping layer below the metal layer.

23. The method of claim 22 wherein forming a stopping layer comprises forming a self-assembled monolayer (SAM).

24. A method of forming an organic transistor comprising:

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

treating a top surface of an additional layer below the metal layer to make the additional layer more resistant to laser light.

25. A method of forming an organic transistor comprising

using laser ablation to define a metal layer in an organic transistor to form a source and a drain of the organic transistor, and a gap there between defining the channel length; and

utilizing laser ablation for cuts into a dielectric layer of the organic transistor to form contacts.

Assignments (3)
MERGER Recorded Dec 18, 2015
From: TAP DEVELOPMENT LIMITED LIABILITY COMPANY
To: GULA CONSULTING LIMITED LIABILITY COMPANY
Reel/Frame 037329/0414 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2012
From: ORGANICID, INC.
To: TAP DEVELOPMENT LIMITED LIABILITY COMPANY
Reel/Frame 027509/0920 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2005
From: DIMMLER, KLAUS
To: ORGANICID, INC.
Reel/Frame 016896/0255 →