Concurrent scanning non-invasive analysis system

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Patent No.: US None
App. No.: 11/206,595

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Abstract

A non-invasive imaging and analysis system suitable for measuring concentrations of specific components, such as blood glucose concentration and suitable for non-invasive analysis of defects or malignant aspects of targets such as cancer in skin or human tissue, includes an optical processing system which generates a probe and composite reference beam. The system also includes a means that applies the probe beam to the target to be analyzed and modulates at least some of the components of the composite reference beam by means of a micro-mirror array, such that signals corresponding to different depths within the target can be separated by electronic processing. The system combines a scattered portion of the probe beam and the composite beam interferometrically to concurrently acquire information from multiple depths within a target. It further includes electronic control and processing systems.

Claims (63)

1 . A method for non-invasive analysis of a target comprising:

generating a probe beam and a reference beam;

separating the reference beam into multiple component reference beams;

modulating at least some of the multiple component reference beams;

re-combining at least part of some of the multiple component reference beams to form a composite reference beam;

applying the probe beam to the target to be analyzed;

capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;

combining the captured scattered probe radiation and the composite reference beam;

detecting the resulting composite interferometric signal to form a composite electronic signal;

separating the composite electronic signal into signals related to concurrent information from different locations within the target; and

processing said concurrent information to achieve non-invasive analysis of the target.

2 . The method of claim 1 , wherein the probe and reference beams are generated by at least one super-luminescent diode.

3 . The method of claim 1 , wherein the probe and reference beams are generated by at least one source of broadband radiation.

4 . The method of claim 1 , wherein the reference beam is separated into component reference beams by at least one beam-splitter.

5 . The method of claim 1 , wherein the reference beam is separated into component reference beams by a partially reflective element.

6 . The method of claim 1 , wherein the reference beam is separated into component reference beams by a MEMS based mirror array.

7 . The method of claim 1 , wherein at least one component reference beam is modulated by the motion of at least one micro-mirror of the MEMS based mirror array.

8 . The method of claim 1 , wherein at least one component reference beam is modulated by sequentially switching micro-mirrors at least some of which have a large physical separation.

9 . The method of claim 1 , wherein at least one component reference beam is modulated by the motion of the MEMS based mirror array.

10 . The method of claim 1 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals with different frequency content.

11 . The method of claim 1 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals that occur at different time intervals.

12 . The method of claim 1 , wherein the signals related to different component reference beams are separated by electronic processing of the detected composite electronic signal.

13 . The method of claim 1 , wherein the concurrent information from different locations within the target is processed to provide scattering information.

14 . The method of claim 13 , wherein the scattering information is analyzed to determine a measurement of an analyte.

15 . The method of claim 14 , wherein the measurement of an analyte is the concentration level of glucose in tissue.

16 . The method of claim 1 , wherein the concurrent information from different locations is analyzed to provide imaging information.

17 . A system for non-invasive analysis of a target, said system comprising:

means for generating a probe beam and a reference beam;

means for separating the reference beam into multiple component reference beams;

means for modulating at least some of the multiple component reference beams;

means for re-combining at least part of some of the multiple component reference beams to form a composite reference beam;

means for applying the probe beam to the target to be analyzed;

means for capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;

means for combining the captured scattered probe radiation and the composite reference beam;

means for detecting the resulting composite interferometric signal to form a composite electronic signal;

means for separating the composite electronic signal into signals related to concurrent information from different locations within the target; and

means for processing said concurrent information to achieve non-invasive analysis of the target.

18 . An apparatus for non-invasive analysis of a target, said apparatus comprising: