Intelligent blemish control algorithm and apparatus
View Patent ↗An image processing method and apparatus is described for processing a signal from a monochrome or color sensor that may be subject to pixel defects or blemishes. Without prior knowledge of any pixel defects, the processing method examines each pixel value and its neighboring pixel values. A number of tests are applied to the set of pixel values to determine whether the underlying pixel is defective. If the underlying pixel is determined to be defective, the pixel value is replaced by an estimate value derived from the values of its neighboring pixels. Otherwise, the pixel value remains intact.
1. An intelligent control circuit operating in real-time for processing pixel defects in a sensor, the control circuit comprising:
a defective pixel detection circuit for detecting whether an underlying pixel is defective;
a pixel value restoration circuit for replacing a value of the underlying pixel, if defective, with a restoration value derived from values of neighboring pixels;
wherein the neighboring pixels comprise a first group and a second group, wherein the first group is processed by the defective pixel detection circuit to detect a first type of defect in the underlying pixel, and wherein the second group is processed by the defective pixel detection circuit separately to detect a second type of defect in the underlying pixel; and
wherein the first group comprises a first plurality of pixels immediately surrounding the underlying pixel, and the second group comprises a second plurality of pixels immediately surrounding the first group.
2. The circuit of claim 1 , wherein the first and second groups form a rectangular shape.
3. The circuit of claim 1 , wherein the first and second groups form a diamond shape.
4. The circuit of claim 1 , wherein the first and second groups incorporate the Bayer pattern.
5. The circuit of claim 1 , wherein the pixel value restoration circuit comprises a line-edge feature detection circuit for detecting whether a line or an edge feature passes through the underlying pixel.
6. The circuit of claim 1 , wherein the pixel value restoration circuit comprises a spatially adaptive interpolation filter for deriving the restoration value.
7. The circuit of claim 1 , wherein the first type of defect is a stuck high.
8. The circuit of claim 1 , wherein the first type of defect is a stuck low.
9. The circuit of claim 1 , wherein the second type of defect is an abnormal sensitivity.
10. A method for real-time processing of pixel defects in a sensor, the method comprising:
measuring a value of an underlying pixel;
determining whether the underlying pixel is defective;
deriving a restoration value from values of neighboring pixels if the underlying pixel is defective;
replacing the value of the underlying pixel with the restoration value;
wherein the neighboring pixels comprise a first group and a second group, wherein the first group is processed by the defective pixel detection circuit to detect a first type of defect in the underlying pixel, and wherein the second group is processed by the defective pixel detection circuit separately to detect a second type of defect in the underlying pixel; and
wherein the first group comprises a first plurality of pixels immediately surrounding the underlying pixel, and the second group comprises a second plurality of pixels immediately surrounding the first group.
11. The method of claim 10 , wherein the first and second groups form a rectangular shape.
12. The method of claim 10 , wherein the first and second groups form a diamond shape.
13. The method of claim 10 , wherein the first and second groups incorporate the Bayer pattern.
14. The method of claim 10 further comprises detecting whether a line or an edge feature passes through the underlying pixel.
15. The method of claim 10 , wherein the deriving the restoration value uses a spatially adaptive interpolation filter.
16. The method of claim 10 , wherein the first type of defect is a stuck high.
17. The method of claim 10 , wherein the first type of defect is a stuck low.
18. The method of claim 10 , wherein the second type of defect is an abnormal sensitivity.