Self-generated test automation
View Patent ↗Self-generated automated tests can use a pseudo-random number generator to select one or more arguments that are passed to programs and scripts. The random arguments are driven by a configuration file where the limits for the parameters are defined. Multidimensional functions with multidimensional parameters can be tested. Test duration can be limited by time, number of iterations, or by any of the multidimensional functions or parameters. A pseudo-random seed for each test is recorded so that a test case can be reproduced if a failure is detected or otherwise.
1. A method of performing a self-generated automated test, comprising:
(A) generating a seed value by a self-generated automated test system;
(B) selecting, by said self-generated automated test system, one or more arguments based on said seed value;
(C) accessing, by said self-generated automated test system, one or more parameters for driving said one or more arguments; and
(D) executing, by said self-generated automated test system, said one or more arguments with said one or more parameters to perform the self-generated automated test.
2. The method of claim 1 , further comprising:
(E) storing, by said self-generated automated test system, said seed value.
3. The method of claim 1 , further comprising:
(E) receiving, by said self-generated automated test system, said one or more arguments from a storage medium.
4. The method of claim 1 , wherein step (A) comprises:
(A)(i) generating said value using a pseudo random number generator.
5. The method of claim 1 , wherein step (A) comprises:
(A)(i) generating a seed value based on time.
6. The method of claim 1 , wherein step (A) comprises:
(A)(i) generating said seed value in response to an event.
7. The method of claim 6 , wherein step (A) further comprises:
(A)(ii) operating a device to be evaluated to thereby produce said event.
8. The method of claim 6 , wherein step (A) further comprises:
(A)(ii) placing a device to be evaluated at a specific location to thereby produce said event.
9. The method of claim 1 , wherein step (A) comprises:
(A)(i) generating said seed value in response to a programmable scheduled event.
10. The method of claim 1 , wherein step (A) comprises:
(A)(i) querying a storage medium to generate said seed value, said seed value being previously generated and recorded at said storage medium, whereby said one or more arguments are executed during said executing step to repeat the self-generated automated test on a device to be evaluated.
11. The method of claim 1 , wherein step (C) comprises:
(C)(i) executing a configuration file to access said one or more parameters.
12. The method of claim 1 , wherein step (C) comprises:
(C)(i) executing a configuration file to randomly access said one or more parameters.
13. The method of claim 1 , wherein step (C) comprises:
(C)(i) accessing a parameter specifying a quantity of iterations for repeating at least a portion of said one or more arguments during said executing step.
14. The method of claim 13 , wherein step (C) further comprises:
(C)(ii) varying at least one parameter during each iteration.
15. The method of claim 1 , wherein step (C) comprises:
(C)(i) enabling an operator to specify at least one parameter.
16. The method of claim 1 , wherein step (C) comprises:
(C)(i) enabling an operator to specify said seed value.
17. A non-transitory machine-readable medium having instructions stored thereon, that when executed by one or more processors, cause the one or more processors to perform a self-generated automated test, the instructions comprising:
instructions for generating a seed value;
instructions for storing one or more arguments selected based on said seed value;
instructions for accessing one or more parameters for driving said one or more arguments; and
instructions for executing said one or more arguments with said one or more parameters to perform a self-generated automated test.
18. The non-transitory machine-readable medium of claim 17 , further comprising:
instructions for recording or retrieving said seed value.
19. The non-transitory machine-readable medium of claim 17 , further comprising:
instructions for recording said one or more arguments.
20. The non-transitory machine-readable medium of claim 17 , wherein said instructions for generating said seed value includes instructions for generating a pseudo random number.
21. The non-transitory machine-readable medium of claim 20 , wherein said instructions for generating said pseudo random number generate said seed value.
22. The non-transitory machine-readable medium of claim 20 , wherein said instructions for generating said pseudo random number generate said seed value based on time.
23. The non-transitory machine-readable medium of claim 20 , wherein said instructions for generating said pseudo random number generate said seed value in response to an event.
24. The non-transitory machine-readable medium of claim 23 , wherein said self-generated automated test system is coupled to a device to be evaluated, said device being operated to thereby produce said event.
25. The non-transitory machine-readable medium of claim 23 , wherein said one or more processors is coupled to a device to be evaluated, said device being placed at a specific location to thereby produce said event.
26. The non-transitory machine-readable medium of claim 20 , wherein said instructions for generating said pseudo random number generate said seed value in response to a programmable scheduled event.
27. The non-transitory machine-readable medium of claim 17 , further comprising:
instructions for storing said seed value, said seed value being previously generated by said instructions for generating and recorded at said storage medium by said instructions for storing said one or more arguments, whereby said instructions for executing executes said one or more arguments to repeat the self-generated automated test on a device to be evaluated.
28. The non-transitory machine-readable medium of claim 17 , wherein said instructions for accessing access said one or more parameters.
29. The non-transitory machine-readable medium of claim 17 , wherein said instructions for accessing randomly access said one or more parameters.
30. The non-transitory machine-readable medium of claim 17 , wherein said instructions for accessing access a parameter specifying a quantity of iterations for repeating at least a portion of said one or more arguments by said instructions for executing.
31. The non-transitory machine-readable medium of claim 30 , wherein said instructions for accessing vary at least one parameter during each iteration.
32. The non-transitory machine-readable medium of claim 17 , wherein said instructions for accessing enable an operator to specify at least one parameter.
33. The non-transitory machine-readable medium of claim 17 , wherein said instructions for accessing enable an operator to specify said seed value.