Apparatus for comparing performance of electronic devices
View Patent ↗A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.
1. A test apparatus comprising:
a data interface configured to couple with at least one of a test device and a baseline device; and
a computing device configured to perform a method comprising
performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline device;
performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device;
determining that the test device is initially acceptable when the total amount of work performed by the test device and the total amount of work performed by the baseline device differ by less than an acceptance threshold; and
when the test device is initially acceptable, performing a quotient test on the first dataset and the second dataset, wherein the test device is determined to be finally acceptable.
2. The test apparatus of claim 1 wherein the first benchmark and the second benchmark are the same benchmark and wherein the test device and the baseline device are produced by the same manufacturer.
3. The test apparatus of claim 1 wherein data points are taken at regular time periods within the predetermined time interval, resulting in the first dataset.
4. The test apparatus of claim 1 wherein the method further comprises analyzing the first dataset and the second dataset using a sign test.
5. The test apparatus of claim 1 wherein the acceptance threshold is less than or equal to five percent of the total amount of work performed by the baseline device within the predetermined time interval.
6. The test apparatus of claim 1 wherein the quotient test comprises:
dividing the standard deviation of the first dataset by the average of the first dataset, producing a first result;
dividing the standard deviation of the second dataset by the average of the second dataset, producing a second result; and
determining whether the difference between the first result and the second result meet previously defined acceptance criteria.