Sensor for analyzing a sample by utilizing localized plasmon resonance
View Patent ↗A sensor chip for use in a sensor for detecting the localized plasmon resonance state of a metal particle surface by light and analyzing properties of a sample present near metal particles. The sensor chip includes a support with a plurality of pits individually and independently formed in one surface thereof so that they extend toward an interior thereof, and metal particle rods respectively held in the plurality of pits so that an end surface of each rod is exposed at the one surface of the support and a longitudinal side surface of each rod is covered with the support.
1. A sensor for detecting a localized plasmon resonance state of a metal particle surface by light and analyzing properties of a sample present near metal particles employing a sensor chip, comprising:
means for irradiating measuring light having a predetermined wavelength band to the rods of metal particles of said sensor chip;
sensor-chip hold means for holding said sensor chip so that the longitudinal axes of said metal particle rods are inclined with respect to an electric field direction of said measuring light, and so that the angle of inclination can be freely changed;
drive means for driving said sensor-chip hold means so that said angle of inclination is changed;
light detection means for spectrally detecting an intensity of said measuring light transmitted through said metal particle rods or reflected at said metal particle rods; and
control means for setting a direction of said sensor-chip hold means so that said angle of inclination is fixed, by controlling operation of said drive means based on said intensity detected by said light detection means;
wherein the sensor chip comprises:
a support with a plurality of pits individually and independently formed in one surface thereof so that they extend toward an interior thereof; and
a plurality of rods of metal particles, whose aspect ratio is not 1, respectively held in said plurality of pits so that an end surface of each rod is exposed at said one surface of said support and a longitudinal side surface of each rod is covered with said support.
2. The sensor as set forth in claim 1 , wherein said support is formed from anodic alumina.
3. The sensor as set forth in claim 1 , wherein said pits are formed in said support by an etching process in which anodic alumina with a plurality of pits is used as a mask.
4. The sensor as set forth in claim 1 , wherein the maximum dimension of said metal particles is 200 nm or less.
5. The sensor as set forth in claim 1 , wherein said metal particles are formed from one of among gold, silver, copper, and aluminum.