IP Library Granted Patent US 7,122,774
Granted Patent B2
US 7,122,774 · App. 11/228,193 · Granted Oct 17, 2006

System and method of wavefront sensing

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Quick Facts
Patent No.
US 7,122,774
App. No.
11/228,193
Granted
Oct 17, 2006
Kind
B2
Abstract

A system and method of wavefront sensing with a Shack-Hartmann wavefront sensor precisely locates focal spots on a detector array, and determines the location of the lenslet array with respect to the detector array.

Claims (28)

1. A method of estimating a location of a center of a focal spot on a detector array comprising a plurality of lenslets and a plurality of pixels adapted to receive light from the plurality of lenslets, the method comprising:

(a) defining pixel boundaries of an integration domain for a lenslet;

(b) measuring pixel values within the boundaries;

(c) calculating a center of mass with respect to the measured pixel values within the boundaries; and

(d) using an asymmetry parameter to correct the calculated center of mass to determine the estimated location of the center of the focal spot.

2. The method of claim 1 , where the pixel boundaries are defined relative to a pixel having a greatest measured value among pixels assigned to the lenslet.

3. The method of claim 1 , wherein step (a) further comprises:

(a1) defining trial pixel boundaries for a trial integration domain for the lenslet;

(a2) measuring trial pixel values within the trial boundaries;

(a3) calculating a trial center of mass with respect to the measured pixel values within the boundaries; and

(a4) defining the pixel boundaries of the integration domain relative to the calculated trial center of mass.

4. The method of claim 1 where the center of mass calculation is performed by thresholding the measured pixel values by a fixed percentage relative to a pixel having a greatest measured value among pixels within the integration domain.

5. The method of claim 1 where the center of mass calculation is performed by subtracting from the measured pixel values a background value based on a maximum measured pixel value at the pixel boundaries.

6. The method of claim 1 , further comprising repeating steps (a) through (d) for the plurality of lenslets.

7. The method of claim 1 where the pixel boundaries are determined from the a calculation of fλ/d with respect to a pixel having a greatest measured value among pixels within the integration domain, where f is lenslet focal length, λ is a wavelength of incident light, and d is lenslet diameter.

8. The method of claim 1 where the asymmetry parameter is obtained by calculating a difference between a physical center of the integration domain and the calculated center of mass.

9. The method of claim 8 , further comprising

(e) defining new pixel boundaries of an integration domain for a lenslet based on the previously estimated location of the center of the focal spot;

(f) measuring new pixel values within the new boundaries;

(g) calculating a new center of mass with respect to the new measured pixel values within the new boundaries;

(h) calculating a new asymmetry parameter as a difference between the physical center of the integration domain and the new calculated center of mass;

(i) using the asymmetry parameter to correct the new calculated center of mass to determine a new estimated location of the center of the focal spot; and

(j) repeating steps (e) through (i) until the asymmetry parameter is minimized.

10. The method of claim 1 , where the calculated center of mass is corrected by a correction value that is a function of the asymmetry parameter.

11. The method of claim 1 , where the calculated center of mass is corrected by a correction value that is a linear function of the asymmetry parameter.

12. The method of claim 11 , wherein the correction value varies according to a location of the calculated center of mass within the pixel boundaries.

13. The method of claim 1 , wherein the pixel boundaries pass through parts of pixels so that the integration domain includes partial pixels.

14. The method of claim 13 , wherein the calculated center of mass is computed using a weighted distribution of the measured pixel values, and wherein the partial pixels are weighted less than other pixels that lie fully within the pixel boundaries.

Assignments (5)
MERGER Recorded Sep 17, 2020
From: AMO WAVEFRONT SCIENCES, LLC
To: AMO DEVELOPMENT, LLC
Reel/Frame 053810/0830 →
RELEASE OF SECURITY INTEREST Recorded Feb 27, 2009
From: BANK OF AMERICA, N.A. AS ADMINISTRATIVE AGENT
To: AMO WAVEFRONT SCIENCES, LLC; FORMERLY WAVEFRONT SCIENCES, INC.
Reel/Frame 022320/0536 →
CHANGE OF NAME Recorded Jan 3, 2008
From: WAVEFRONT SCIENCES, INC.
To: AMO WAVEFRONT SCIENCES, LLC
Reel/Frame 020309/0383 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Jun 29, 2007
From: WAVEFRONT SCIENCES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 019501/0287 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2007
From: TOPA, DANIEL M.
To: WAVEFRONT SCIENCES, INC.
Reel/Frame 018972/0420 →