IP Library Granted Patent US 7,151,976
Granted Patent B2
US 7,151,976 · App. 11/229,153 · Granted Dec 19, 2006

Multivariate control of semiconductor processes

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Quick Facts
Patent No.
US 7,151,976
App. No.
11/229,153
Granted
Dec 19, 2006
Kind
B2
Abstract

A method for detecting a fault condition of a manufacturing process involving acquiring data and developing a model based on a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process. The method also involves identifying which of the manufacturing related variables have a substantial affect on the model for detecting faulty outputs of the manufacturing process. The method also involves updating the model by using the manufacturing related variables identified as having a substantial affect on the model to improve the ability of the model to detect faulty outputs of the manufacturing process.

Claims (30)

1. A method for detecting a fault condition of a manufacturing process, comprising:

a) acquiring data associated with a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process;

b) developing a model based on the data for detecting faulty outputs of the manufacturing process;

c) automatically identifying which of the manufacturing related variables have a substantial effect on the model for detecting faulty outputs of the manufacturing process using a mathematical algorithm; and

d) updating the model by using the manufacturing related variables identified in step c) to improve the ability of the model to detect faulty outputs of the manufacturing process,

wherein using a mathematical algorithm comprises,

i) identifying a linear equation of a selected variable to the origin of the loadings associated with the mode;

ii) identifying linear equations of the manufacturing related variables that are perpendicular to the linear equation of step i);

iii) solving the simultaneous equations between every manufacturing related variable linear equation and the linear equation of step i) to obtain a projection point of each manufacturing related variable on the linear equation of step i);

iv) determining the distance between each projection point to the origin;

v) calculating a correlation coefficient based on a ratio of distance between the origin and each projected point relative to distance of the selected variable to the origin; and

vi) identifying the substantial manufacturing related variables by selecting the manufacturing related variables that have a correlation coefficient greater than a predefined number.

2. The method of claim 1 , wherein steps b), c) and d) comprise utilizing a multivariate analysis technique.

3. The method of claim 1 , wherein step b) comprises computing principal components and loadings associated with the model using a non-linear iterative partial least square method and singular value decomposition.

4. The method of claim 1 , wherein step c) comprises utilizing a partial least square discrimination analysis method.

5. The method of claim 1 , wherein the selected variable is a fault condition or a metrology metric value.

6. The method of claim 1 , wherein the predefined number is selected by a user.

7. A method for detecting a fault condition of a manufacturing process, comprising:

a) identifying which of a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process have a substantial effect on a model for detecting faulty outputs of a manufacturing process by:

i) identifying a linear equation of a selected variable to the origin of the loadings associated with the model;

ii) identifying linear equations of the manufacturing related variables that are perpendicular to the linear equation of step i);

iii) solving the simultaneous equations between every manufacturing related variable linear equation and the linear equation of step i) to obtain a projection point of each manufacturing related variable on the linear equation of step i);

iv) determining the distance between each projection point to the origin;

v) calculating a correlation coefficient based on a ratio of distance between the origin and each projected point relative to distance of the selected variable to the origin; and

vi) identifying the substantial manufacturing related variables by selecting the manufacturing related variables that have a correlation coefficient greater than a predefined number; and

b) automatically updating the model by using the manufacturing related variables identified in step a) to improve the ability of the model to detect faulty outputs of the manufacturing process.

8. The method of claim 7 , wherein steps a) and b) comprise utilizing a multivariate analysis technique.

9. The method of claim 7 , wherein step a) comprises utilizing a partial least square discrimination analysis method.

10. The method of claim 7 , wherein the selected variable is a fault condition or a metrology metric value.

11. The method of claim 7 , wherein the predefined number is selected by a user.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
PARTIAL RELEASE OF SECURITY INTEREST Recorded Jul 11, 2019
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.
Reel/Frame 049728/0509 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
CHANGE OF NAME Recorded Oct 23, 2017
From: MKS INSTRUMENTS AB
To: SARTORIUS STEDIM DATA ANALYTICS AB
Reel/Frame 044256/0882 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2017
From: SARTORIUS STEDIM BIOTECH GMBH
To: MKS INSTRUMENTS AB
Reel/Frame 043888/0860 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2017
From: MKS INSTRUMENTS, INC
To: SARTORIUS STEDIM BIOTECH GMBH
Reel/Frame 043630/0870 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2005
From: LIN, KUO-CHIN
To: MKS INSTRUMENTS, INC.
Reel/Frame 017017/0629 →