System, method, and computer product for detection instrument calibration
View Patent ↗In one embodiment, a method of determining a drift value is described that includes performing one or more X-axis translations of an excitation beam over a probe array; measuring light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations; calculating a distance value for the X-axis translation using a positional relationship of a known location associated with each of the positional reference elements and positions of the positional reference elements from the measured light; and determining a drift value using a difference between the calculated distance value and an expected distance value.
1. A method of determining a drift value, comprising:
performing one or more X-axis translations of an excitation beam over a probe array;
measuring light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations;
calculating a distance value for the X-axis translation using a positional relationship of a known location associated with each of the positional reference elements and positions of the positional reference elements from the measured light; and
determining a drift value using a difference between the calculated distance value and an expected distance value.
2. The method of claim 1 , further comprising:
applying the drift value to a plurality of pixels of an image of a plurality of probe features acquired from the probe array prior to grid placement.
3. The method of claim 2 , wherein:
the drift value is applied to one or more pixels in a plurality of rows in the image.
4. The method of claim 1 , wherein:
the X-axis translation of the excitation beam is performed by an element selected from the group consisting of a galvo arm, a rotating mirror, and a voice coil.
5. The method of claim 1 , wherein:
the responsive light comprises reflected light.
6. The method of claim 1 , wherein:
the responsive light comprises fluorescent light.
7. The method of claim 1 , wherein:
the positional reference elements comprise at least two edges of a chrome border.
8. The method of claim 1 , wherein:
the positional reference elements are located in the active area of the probe array.
9. The method of claim 8 , wherein:
the positional reference elements comprise reflective elements.
10. The method of claim 8 , wherein:
the positional reference elements comprise fluorescent control features.
11. The method of claim 1 , wherein:
the drift value comprises a measure of error associated with each pixel in a row of pixels and is determined while acquiring sample image data.
12. The method of claim 11 , wherein:
the row of pixels comprises a pre-defined number of pixels.
13. The method of claim 11 , wherein:
the pixels are associated with an image of a plurality of probe features acquired from the probe array.
14. A system for determining a drift value, comprising:
a translation element that performs one or more X-axis translations of an excitation beam over a probe array;
one or more detectors that measure light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations;
a software application stored for execution is system memory of a computer that performs the method of:
calculating a distance value associated with the X-axis translation;
determining a drift value using a difference between the calculated distance value and an expected distance value.
15. The system of claim 14 , wherein:
the software application applies the drift value to a plurality of pixels of an image of a plurality of probe features acquired from the probe array prior to grid placement.
16. The system of claim 15 , wherein:
the drift value is applied to one or more pixels in a plurality of rows in the image.
17. The system of claim 14 , wherein:
the translation element is selected from the group consisting of a galvo arm, a rotating mirror, and a voice coil.
18. The system of claim 14 , wherein:
the responsive light comprises reflected light.
19. The system of claim 14 , wherein:
the responsive light comprises fluorescent light.
20. The system of claim 14 , wherein:
the positional reference elements comprise at least two edges of a chrome border.
21. The system of claim 14 , wherein:
the positional reference elements are located in the active area of the probe array.
22. The system of claim 21 , wherein:
the positional reference elements comprise reflective elements.
23. The method of claim 21 , wherein:
the positional reference elements comprise fluorescent control features.
24. The system of claim 14 , wherein:
the drift value comprises a measure of error associated with each pixel in a row of pixels and is determined while acquiring sample image data.
25. The system of claim 24 , wherein:
the measure of error is associated with one or more factors affecting the performance of the translation element.
26. The system of claim 25 , wherein:
the one or more factors are selected from the group consisting of temperature fluctuation, mechanical wear, component imperfections, and physical insult.
27. The system of claim 25 , wherein:
the row of pixels comprises a pre-defined number of pixels.
28. The system of claim 24 , wherein:
the pixels are associated with an image of a plurality of probe features acquired from the probe array.
29. A method of correcting X-axis error in a probe array image, comprising:
performing one or more X-axis translations of an excitation beam over a probe array;
measuring light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations;
calculating a distance value for the X-axis translation using a positional relationship of a known location associated with each of the positional reference elements and positions of the positional reference elements from the measured light;
determining a drift value using a difference between the calculated distance value and an expected distance value; and
applying the drift value to a plurality of pixels of an image of a plurality of probe features acquired from the probe array prior to grid placement.
30. A probe array scanner for correcting X-axis error in a probe array image, comprising:
a probe array scanner that comprises;
a translation element that performs one or more X-axis translations of an excitation beam over a probe array;
one or more detectors that measure light responsive to the excitation beam from at least two positional reference elements associated with the probe array for the X-axis translations; and
a software application stored for execution in system memory of a computer that performs the method of:
calculating a distance value for the X-axis translation using a positional relationship of a known location associated with each of the positional reference elements and positions of the positional reference elements from the measured light; determining a drift value using a difference between the calculated distance value and an expected distance value; and applying the drift value to a plurality of pixels of image of a plurality of probe features acquired from the probe array prior to grid placement.