Devices and method for spectral measurements
View Patent ↗A spectral measurement device comprising an entrance aperture for receiving an electromagnetic energy and a mask located at the entrance aperture in the form of a two-dimensional encodement pattern. An optical element conditions the electromagnetic energy received from the mask for presentation to the spectral dispersion element and the and a spectral dispersion element disperses the electromagnetic energy in one or more dimensions. Additionally, the optical element conditions the dispersed electromagnetic energy onto an array of detector elements.
1. A spectral measurement device comprising:
a mask aperture in the form of a two-dimensional encodement pattern disposed to receive an input of an electromagnetic energy, wherein said input of said electromagnetic energy is a diffuse input and non-imaging;
a spectral dispersion element for dispersing said electromagnetic energy in one or more dimensions to provide a dispersed electromagnetic energy;
an array of detector elements; and
an optical element for conditioning said electromagnetic energy received from said mask aperture for presentation to said spectral dispersion element and conditioning said dispersed electromagnetic energy onto said array of detector elements.
2. The spectral measurement device of claim 1 , wherein said optical element comprises a first optical element for conditioning said electromagnetic energy received from said mask aperture for presentation to said spectral dispersion element and a second optical element for conditioning said dispersed electromagnetic energy onto said array of detector elements.
3. The spectral measurement device of claim 1 , wherein said electromagnetic energy is one of the following: optical energy, infrared energy, ultraviolet energy, far-infrared energy, or microwave energy.
4. The spectral measurement device of claim 1 , wherein said mask aperture is encoded with a Hadamard pattern of elements.
5. The spectral measurement device of claim 1 , wherein said mask aperture comprises at least one of the following: a two dimensional (2D) array of reflective and non-reflective mask elements, a two dimensional (2D) array of open and closed mask elements, an array of wavelength filter elements, an array of optical density filter elements, a spatial light modulator, a two dimensional (2D) array of transmissive and non-transmissive mask elements, and a removable mask module.
6. The spectral measurement device of claim 1 , wherein said optical element is one of the following: a refractive lens element or a reflective lens element.
7. The spectral measurement device of claim 1 , wherein said optical element is operable to collimate said electromagnetic energy received from said mask aperture.
8. The spectral measurement device of claim 1 , wherein said optical element is operable to focus said electromagnetic energy received from said mask aperture.
9. The spectral measurement device of claim 1 , wherein said spectral dispersion element is one of the following: a volume type diffraction element, a holographically ruled diffraction element, a mechanically ruled diffraction element, an array of bragg diffraction gratings, an acousto-optical diffraction device, an tunable diffraction grating, or a micro-electromechanical systems (MEMS) device.
10. The spectral measurement device of claim 1 , wherein said mask aperture comprises spatially differentiated mask elements; and wherein said spectral dispersion element comprises line densities exposed to a plurality of spatially differentiated electromagnetic energy propagating from said spatially differentiated mask elements such that the magnitude of diffraction is varied for said spatially differentiated mask elements.
11. The spectral measurement device of claim 10 , wherein said line densities are programmable line densities.
12. The spectral measurement device of claim 1 , wherein said array of detector elements is a linear array of detector elements or a two dimensional (2D) array of detector elements.
13. The spectral measurement device of claim 12 , wherein said array of detector elements is a linear array of detector elements; and wherein each detector element is set to receive light from a corresponding row of said two-dimensional encodment pattern of said mask aperture.
14. The spectral measurement device of claim 1 , wherein each detector element receives a different spectral range of said electromagnetic energy.
15. The spectral measurement device of claim 1 , wherein said mask aperture is encoded with arbitrary fixed weighted combinations of spectral components selected to directly measure predetermined spectral features.
16. The spectral measurement device of claim 15 , wherein said predetermined spectral features are the positive and negative parts of one or more features from a set consisting of regression vectors, principal component vectors of a spectral model, and local discriminative basis (LDB) vectors.
17. A spectral measurement device comprising:
a mask aperture in the form of a two-dimensional encodement pattern disposed to receive an input of an electromagnetic energy, wherein said input of said electromagnetic energy is a diffuse input and nonimaging;
a concave grating for conditioning and dispersing said electromagnetic energy in one or more dimensions to provide a dispersed electromagnetic energy; and
an array of detector elements for receiving said dispersed electromagnetic energy from said concave grating.
18. A method for spectral measurement, comprising the steps of:
receiving an input of an electromagnetic energy through a mask aperture in the form of a two-dimensional encodement pattern, wherein said input of said electromagnetic energy is a diffuse input and non-imaging;
dispersing said electromagnetic energy in one or more dimensions to provide a dispersed electromagnetic energy;
conditioning said electromagnetic energy received from said mask aperture for presentation to a spectral dispersion element and conditioning said dispersed electromagnetic energy onto an array of detector elements.