Measuring method and system
View Patent ↗A measuring signal in the detecting area is calibrated on the basis of a measuring signal in the reference area by the reference method. The rate of change with time of the difference between the measuring signal and an estimated result of the measurement (ORU constant) is calculated in the period where it is expected that the signal shows a fixed value and the components which change at a rate of change calculated for the entire period of the measuring period with the instance when a buffer containing thereon an analyte is supplied taken as a reference are taken as the drift components and correction to remove the drift components from the measuring signal is carried out.
1. A measuring method comprising:
carrying out the measurement for a predetermined period in each of a detecting area in a film layer in which a ligand is fixed and a reference area of the film layer in which no ligand is fixed,
calibrating a first result of the measurement in the detecting area on the basis of a second result of the measurement in the reference area,
determining drift components from the first result after the calibration, and
removing the drift components from the first result.
2. A measuring method as defined in claim 1 in which a predetermined method is used to perform the correcting in which
a rate of change with time of a difference between an estimated result of the measurement and an actual result of the measurement is calculated for a part of a predetermined period and
components which change at a rate of change are taken as the drift components,
wherein the rate of change is calculated for a entire period of the predetermined period with a predetermined point in the predetermined period taken as a reference.
3. A measuring method comprising:
carrying out the measurement for a predetermined period in each of a detecting area of a film layer in which ligands are fixed and a reference area of the film layer in which no ligands are fixed,
extracting first drift components from a first result of measurement in the detecting area,
correcting the first result by removing the first drift components from the first result,
extracting second drift components from a second result of measurement in the detecting area,
correcting the second result by removing the second drift components from the second result, and
calibrating the first result after the correction on the basis of the second result.
4. A measuring method as defined in claim 3 in which a predetermined method is used to perform the correcting in which
a rate of change with time of a difference between an estimated result of the measurement and an actual result of the measurement is calculated for a part of a predetermined period and
components which change at a rate of change are taken as the drift components
wherein the rate of change is calculated for a entire period of the predetermined period with a predetermined point in the predetermined period taken as a reference.
5. A measuring system comprising
a calibrating means operable to calibrate a result of a first measurement in a detecting area of a film layer having ligands fixed to it, the calibration being performed on a basis of a result of a second measurement in a reference area of the film layer having no ligands fixed to it, the first and the second measurement being carried out for a same predetermined period, and
a correcting means operable to remove drift components from the first result after the calibration, the drift components being extracted from the first result.
6. A measuring system as defined in claim 5 in which the correcting means is operable to perform correction using a procedure in which
a rate of change with time of a difference between an estimated result of the measurement and an actual result of the measurement is calculated for a part of a predetermined period and
components which change at a rate of change are taken as the drift components
wherein the rate of change is calculated for a entire period of the predetermined period with a predetermined point in the predetermined period taken as a reference.
7. A measuring system comprising
a correcting means operable to correct a first result of measurement in a detecting area of a film layer having ligands fixed to it, the correcting being done to remove first drift components from the first result, the first drift components being extracted from the first result,
the first correcting means further operable to correct a second result of measurement in a reference area of the film layer having no ligands fixed to it, the correcting being done to remove second drift components from the second result, the second drift components being extracted from the second result, and
a calibrating means operable to calibrate the first result based on the second result.
8. A measuring system as defined in claim 7 in which the correcting means is operable to perform correction using a procedure in which
a rate of change with time of a difference between an estimated result of the measurement and an actual result of the measurement is calculated for a part of a predetermined period and
the components which change at a rate of change are taken as the drift components
wherein the rate of change is calculated for a entire period of the predetermined period with a predetermined point in the predetermined period taken as a reference.