IP Library › Patent Application 11269560
Patent Application Utility
App. No. 11/269,560 · Confirmation No. 6012

Abnormal pattern candidate detecting method and apparatus

Inventor: Akira Oosawa
Abandoned -- Failure to Respond to an Office Action View Publication ↗
⬇ PDF
 Code Description Pages PDF
2009-10-15 BIB Bibliographic Data Sheet 1 View
2009-10-15 ABN Abandonment 2 View
2009-02-25 CTNF Non-Final Rejection 11 View
2009-02-25 892 List of references cited by examiner 1 View
2009-02-25 FWCLM Index of Claims 1 View
2009-02-25 BIB Bibliographic Data Sheet 1 View
2009-02-25 SRNT Examiner's search strategy and results 8 View
2009-02-25 1449 List of References cited by applicant and considered by examiner 4 View
2009-02-25 SRNT Examiner's search strategy and results 4 View
2009-02-25 SRFW Search information including classification, databases and other search related notes 1 View
2006-07-11 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2005-11-09 TRNA Transmittal of New Application 2 View
2005-11-09 SPEC Specification 52 View
2005-11-09 CLM Claims 5 View
2005-11-09 ABST Abstract 1 View
2005-11-09 DRW Drawings-only black and white line drawings 14 View
2005-11-09 OATH Oath or Declaration filed 3 View
2005-11-09 WFEE Fee Worksheet (SB06) 1 View
2005-11-09 WFEE Fee Worksheet (SB06) 1 View
2005-11-09 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2005-11-09 FOR Foreign Reference 27 View
2005-11-09 FRPR Certified Copy of Foreign Priority Application 37 View
2005-11-09 136A Authorization for Extension of Time all replies 2 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
App. No.
11/269,560
Filed
2005-11-09
Pub. No.
US20060098854A1
Art Unit
2624