Uniform power density across processor cores at burn-in
View Patent ↗A computer implemented method, data processing system, and computer usable code are provided for burn-in testing of a multiprocessor. A process identifies a power management data set for a plurality of processor cores associated with the multiprocessor. The process selects one or more of the plurality of processor cores to form a selected set of processor cores based upon the power management data set. The process initiates a burn-in test across the selected set of processor cores. In response to a determination that all processor cores in the plurality of processor cores have not been selected, the process repeats the above selecting and initiating steps until all the processor cores have been selected.
1. A computer implemented method for burn-in testing of a multiprocessor, the method comprising:
identifying a power management data set for a plurality of processor cores associated with the multiprocessor;
selecting a set of processor cores based upon the power management data set, wherein the set of processor cores comprises at least one processor core selected from the plurality of processor cores;
initiating a burn-in test across the selected set of processor cores; and
responsive to a determination that all the processor cores in the plurality of processor cores have not been selected, repeating the above selecting and initiating steps.
2. The computer implemented method of claim 1 , wherein the selecting step further comprises:
analyzing the power management data set to determine a power usage for each processor core in the plurality of processor cores; and
selecting the set of processor cores based on an average power usage for the set of processor cores.
3. The computer implemented method of claim 2 , wherein the selecting step further comprises:
selecting a set of processor cores with an average power usage that will provide a uniform power distribution during the burn-in testing.
4. The computer implemented method of claim 1 , wherein the identifying step further comprises:
performing a wafer test to determine power management data for each processor core to form the set of power management data.
5. The computer implemented method of claim 4 , wherein power management data for a processor core includes at least one of an operational power usage, a standby power usage, a thermal capacity, a thermal limit, and an execution speed for the processor core.
6. The computer implemented method of claim 1 , wherein the initiating step further comprises:
associating a voltage pin with each processor core in the plurality of processor cores, wherein each voltage pin associated with a processor core in the selected set of processor cores forms a set of voltage pins; and
applying a first voltage across at least one voltage pin in the set of voltage pins.
7. The computer implemented method of claim 6 further comprising:
applying a second voltage across at least one voltage pin in the set of voltage pins, wherein the second voltage is different from the first voltage.
8. The computer implemented method of claim 1 , wherein the initiating step further comprises:
controlling a voltage applied to the selected set of processor cores by a set of voltage offset networks associated with the selected set of processor cores.
9. The computer implemented method of claim 1 , wherein the multiprocessor is heterogeneous.