IP Library Granted Patent US 7,697,121
Granted Patent B1
US 7,697,121 · App. 11/292,317 · Granted Apr 13, 2010

Sensing system having wavelength reflectors that receive modulated light signals

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Quick Facts
Patent No.
US 7,697,121
App. No.
11/292,317
Granted
Apr 13, 2010
Kind
B1
Abstract

The sensing system includes a plurality of modulators that are each configured to modulate a different light signal. The sensing system also includes optical pathways that transport the modulated light signals to one or more wavelength reflectors. Each wavelength reflector is configured to reflect a portion of the modulated light signals at a characteristic wavelength that is a function of an influence external to the wavelength reflector. The sensing system also includes a light sensor configured to receive the reflected light signals and to output a modulated electrical signal that is a function of the power of each of the reflected light signals. The sensing system can also include electronics configured to employ the modulated electrical signal so as to determine one or more results selected from a group consisting of: the characteristic wavelength of one or more of the wavelength reflectors and a level of the external influence on one or more of the wavelength reflectors. Examples of external influences include, but are not limited to, strain, stress, temperature, and properties of materials contacting the wavelength reflector such as index of refraction or pH.

Claims (44)

1. A sensing system, comprising:

a plurality of modulators that are each configured to modulate a different light signal;

one or more optical pathways configured to transport the modulated light signals to one or more wavelength reflectors, each wavelength reflector being configured to reflect a portion of the modulated light signals at a characteristic wavelength that is a function of an influence external to the wavelength reflector; and

a light sensor configured to receive the reflected light signals and to output a modulated electrical signal that is a function of the power of each of the reflected light signals;

wherein one or more of the modulated light signals has a range of wavelengths that does not overlap the characteristic wavelength range for any of the wavelength reflectors.

2. The sensing system of claim 1 , wherein the wavelength reflector is a Bragg grating on an optical fiber.

3. The sensing system of claim 1 , further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine one or more results selected from a group consisting of: the characteristic wavelength of one or more of the wavelength reflectors and a level of the external influence for one or more of the wavelength reflectors.

4. The sensing system of claim 3 , wherein the electronics are:

configured to apply a different modulation signal to each of the modulators so as to modulate the different light signals; and

configured to employ the modulated electrical signal so as to determine the one or more results.

5. The sensing system of claim 1 , wherein the one or more optical pathways are configured to transport the modulated light signals to more than one of the wavelength reflectors and further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine a variable or set of variables that indicate the absolute or relative power levels of two or more of the reflected light signals.

6. The sensing system of claim 5 , wherein the variable is a function of a ratio of a function of a power of one of the reflected light signals: a function of a power of another of the reflected light signals.

7. The sensing system of claim 5 , wherein the variable is function of the frequency, amplitude, and/or phase of the electrical signal.

8. The sensing system of claim 5 , wherein the electronics are configured to employ the modulated electrical signal from the light sensor so as to determine a variable that indicates a temperature of one or more of the wavelength reflectors.

9. The sensing system of claim 1 , further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine one or more results selected from a group consisting of: the characteristic wavelength of one or more of the wavelength reflectors and a level of the external influence on one or more of the wavelength reflectors;

electronics configured to employ the modulated electrical signal from the light sensor so as to correct the one or more results for variations in an unwanted external influence.

10. The sensing system of claim 1 , further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine the characteristic wavelength of one or more of the wavelength reflectors.

11. The sensing system of claim 1 , further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine a variable that indicates a power level for one or more light signals having a range of wavelengths that does not fall within the characteristic wavelength range for any of the wavelength reflectors.

12. A sensing system comprising:

a demultiplexer configured to receive light that includes light signals and demultiplex the light signals;

a plurality of modulators, each modulator being configured to modulate a different one of the light signals so as to generate a modulated light signal;

a multiplexer configured to multiplex the modulated light signals;

an optical fiber component having one or more wavelength reflectors that receive the multiplexed light signals, each wavelength reflector being configured to reflect a portion of the modulated light signals at a characteristic wavelength that is a function of an influence external to the wavelength reflector;

a light sensor configured to receive the reflected light signals and to output a modulated electrical signal that is a function of the power of each of the reflected light signals; and

electronics configured to apply a different modulation signal to each of the modulators to modulate the light signals, and also being configured to employ the modulated electrical signal from the light sensor so as to determine one or more results selected from a group consisting of: the characteristic wavelength of one or more of the wavelength reflectors and a level of the external influence on one or more of the wavelength reflectors;

wherein the demultiplexer, the modulators, and the multiplexer are each on the same silicon-on-insulator chip,

the silicon-on-insulator chip having a layer of silicon and the light signals traveling through the layer of silicon as the light signals travel through the demultiplexer, the modulators, and the multiplexer.

13. The system of claim 12 , wherein the wavelength reflectors are each a Bragg grating.

14. The system of claim 12 , wherein the external influence is a strain.

15. The system of claim 12 , wherein the optical fiber component has more than one of the wavelength reflectors and further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to determine a variable or set of variables that indicate the absolute or relative power levels of two or more of the reflected light signals.

16. The system of claim 15 , wherein the variable is a function of a ratio of a function of a power of one of the reflected light signals: a function of a power of another of the reflected light signals.

17. The system of claim 15 , wherein the electronics are configured to employ the modulated electrical signal from the light sensor so as to determine a variable that indicates a temperature of one or more of the wavelength reflectors.

18. The system of claim 17 , further comprising:

electronics configured to employ the modulated electrical signal from the light sensor so as to correct the one or more results for variations in an unwanted external influence.

19. The system of claim 12 , wherein one or more of the light signals has a range of wavelengths that does not fall within the characteristic wavelength range for any of the wavelength reflectors.

20. The system of claim 12 , wherein the electronics are configured to employ the modulated electrical signal from the light sensor so as to determine the characteristic wavelength of one or more of the wavelength reflectors.

21. The system of claim 12 , wherein the electronics are configured to employ the modulated electrical signal from the light sensor so as to determine a variable that indicates a power level for one or more light signals having a range of wavelengths that does not fall within the characteristic wavelength range for any of the wavelength reflectors.

22. The system of claim 12 , wherein the demultiplexer and the multiplexer are each an array waveguide grating.

Assignments (5)
MERGER Recorded Aug 16, 2023
From: MELLANOX TECHNOLOGIES SILICON PHOTONICS INC.
To: MELLANOX TECHNOLOGIES, INC.
Reel/Frame 064602/0330 →
RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL AT REEL/FRAME NO. 37897/0418 Recorded Jul 13, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MELLANOX TECHNOLOGIES SILICON PHOTONICS INC.
Reel/Frame 046542/0669 →
PATENT SECURITY AGREEMENT Recorded Feb 23, 2016
From: MELLANOX TECHNOLOGIES SILICON PHOTONICS INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037897/0418 →
CHANGE OF NAME Recorded Jan 19, 2016
From: KOTURA, INC.
To: MELLANOX TECHNOLOGIES SILICON PHOTONICS INC.
Reel/Frame 037560/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2006
From: COROY, TRENTON GARY; SMITH, BERNARD THOMAS
To: KOTURA, INC.
Reel/Frame 017643/0113 →