IP Library Granted Patent US 7,326,963
Granted Patent B2
US 7,326,963 · App. 11/292,519 · Granted Feb 5, 2008

Nitride-based light emitting heterostructure

Assignee: Sensor Electronic Technology, Inc.
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Quick Facts
Patent No.
US 7,326,963
App. No.
11/292,519
Granted
Feb 5, 2008
Kind
B2
Abstract

An improved nitride-based light emitting heterostructure is provided. The nitride-based light emitting heterostructure includes an electron supply layer and a hole supply layer with a light generating structure disposed there between. The light generating structure includes a set of barrier layers, each of which has a graded composition and a set of quantum wells, each of which adjoins at least one barrier layer. Additional features, such as a thickness of each quantum well, can be selected/incorporated into the heterostructure to improve one or more of its characteristics. Further, one or more additional layers that include a graded composition can be included in the heterostructure outside of the light generating structure. The graded composition layer(s) cause electrons to lose energy prior to entering a quantum well in the light generating structure, which enables the electrons to recombine with holes more efficiently in the quantum well.

Claims (37)

1. A nitride-based light emitting heterostructure comprising:

an electron supply layer;

a hole supply layer; and

a light generating structure disposed between the electron supply layer and the hole supply layer, the light generating structure including:

a set of barrier layers, each barrier layer comprising a graded composition; and

a set of quantum wells, each quantum well adjoined by a barrier layer and having a thickness less than a characteristic radius of a defect responsible for nonradiative recombination, wherein the graded composition of each barrier layer causes electrons to lose energy prior to entering a quantum well.

2. The nitride-based light emitting heterostructure of claim 1 , wherein a thickness of each quantum well is such that an electron ground state of each quantum well is above a band bending range of energies caused by a set of polarization effects.

3. The nitride-based light emitting heterostructure of claim 1 , each barrier layer comprising one of an AlGaN or an AlGaInN composition.

4. The nitride-based light emitting heterostructure of claim 1 , further comprising an electron blocking layer disposed between the light generating structure and the hole supply layer.

5. The nitride-based light emitting heterostructure of claim 4 , wherein the electron blocking layer comprises a graded composition that transitions from a hole supply layer composition to an electron blocking layer composition.

6. The nitride-based light emitting heterostructure of claim 1 , wherein the hole supply layer comprises a graded composition that transitions from a hole supply layer composition to an electron blocking layer composition closer to the light generating structure.

7. The nitride-based light emitting heterostructure of claim 1 , further comprising:

a substrate;

a buffer layer on the substrate; and

a strain-relieving structure over the buffer layer.

8. The nitride-based light emitting heterostructure of claim 1 , wherein the electron supply layer comprises an n-type contact layer and wherein the hole supply layer comprises a p-type contact layer.

9. The nitride-based light emitting heterostructure of claim 1 , further comprising at least one barrier layer adjacent to the electron supply layer, the at least one barrier layer comprising a graded composition that creates a band structure profile such that electrons entering the light generating structure have an energy that is approximately the same as an energy of a polar optical phonon.

10. The nitride-based light emitting heterostructure of claim 1 , further comprising at least one barrier layer adjacent to the hole supply layer, the at least one barrier layer comprising a graded composition that creates a band structure profile such that holes entering the light generating structure have an energy that is approximately the same as an energy of a polar optical phonon.

11. The nitride-based light emitting heterostructure of claim 1 , wherein the hole supply layer comprises a doped short period superlattice.

12. The nitride-based light emitting heterostructure of claim 1 , further comprising a p-type layer disposed between the light generating structure and the hole supply layer.

13. The nitride-based light emitting heterostructure of claim 1 , further comprising a Distributive Bragg Reflector (DBR) structure disposed over the light generating structure.

14. The nitride-based light emitting heterostructure of claim 13 , wherein the DBR structure comprises a doped p-type composition.

15. The nitride-based light emitting heterostructure of claim 1 , further comprising an anodized aluminum layer disposed over the hole supply layer.

16. The nitride-based light emitting heterostructure of claim 15 , wherein the hole supply layer and the anodized aluminum layer comprise a plurality of holes that form a photonic crystal.

17. The nitride-based light emitting heterostructure of claim 15 , wherein the hole supply layer includes a set of holes, each of which is aligned with a hole in the anodized aluminum layer.

18. The nitride-based light emitting heterostructure of claim 17 , wherein at least one of the set of holes includes a material having a different refractive index than a composition of the p-type layer.

19. A nitride-based light emitting device comprising:

a substrate;

a buffer layer on the substrate;

a strain-relieving structure over the buffer layer;

an electron supply layer over the strain-relieving structure;

a hole supply layer; and

a light generating structure disposed between the electron supply layer and the hole supply layer, the light generating structure including:

a set of barrier layers, each barrier layer comprising a graded composition; and

a set of quantum wells, each quantum well adjoined by a barrier layer and having a thickness less than a characteristic radius of at least one defect responsible for nonradiative recombination.

20. The nitride-based light emitting device of claim 19 , configured to operate as one of a light emitting diode or a laser.

21. The nitride-based light emitting heterostructure of claim 1 , wherein each barrier layer has a varying composition of Aluminum that increases a baffler for electrons and reduces a barrier for holes at a boundary with a quantum well as compared to a baffler layer having a constant composition of Aluminum.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2006
From: GASKA, REMIGIJUS; ZHANG, JIANPING; SHUR, MICHAEL
To: SENSOR ELECTRONIC TECHNOLOGY, INC.
Reel/Frame 017210/0353 →
Continuity (2)
Provisional Application 6063382800 · Dec 6, 2004
Related Publication 20060118820A1 · Jun 8, 2006