Vertical trench gate transistor semiconductor device and method for fabricating the same
View Patent ↗A first region functioning as a transistor includes a drain region, a body region formed over the drain region, a source region formed over the body region and a trench formed through the body region and having a gate electrode buried therein. A source region is formed over the body region extending in a second region. The source region forming an upper edge of the trench is rounded.
1. A vertical trench gate transistor semiconductor device comprising:
a drain region;
a first body region formed over the drain region;
a second body region formed over a part of the first body region;
a first source region formed over another part of the first body region;
a second source region formed over the second body region and electrically connected to the first source region;
a trench formed through the first source region, the second source region, the first body region, and the second body region; and
a gate disposed in the trench;
wherein the second source region functions as an electrical contact for the first source region while the second body region functions as an electrical contact for the first body region, and
an upper edge of a wall face of the trench is rounded.
2. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein the first source region and the second source region are exposed at the upper edge of the wall face of the trench, and the first source region and the second source region which are exposed at the upper edge of the wall face of the trench are rounded.
3. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein parts of the wall face of the trench from the upper edge to upper faces of the first source region and the second source region are rounded entirely.
4. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein a thickness of the second source region is smaller than a thickness of the first source region.
5. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein the second source region covers an entirety of the second body region.
6. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein an impurity concentration of an upper part of the second body region is higher than an impurity concentration of a lower part of the second body region.
7. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein a gate region is formed so as to form a recessed part in an upper part of the trench, and
the second body region is exposed at a wall face of the recessed part.
8. The vertical trench gate transistor semiconductor device of claim 1 ,
wherein a gate region is formed so as to form a recessed part in an upper part of the trench, and
the first source region and the second source region are exposed at the wall face of the recessed part and are in contact through the respective exposed parts and upper faces of the respective source regions.
9. The vertical trench gate transistor semiconductor device of claim 7 ,
wherein the second body region includes, in an upper portion thereof, a heavily doped region of which impurity concentration is relatively high, and
the heavily doped region is exposed at the wall face of the recessed part and is in electrical contact through the exposed part.
10. The vertical trench gate transistor semiconductor device of claim 7 ,
wherein the second source region and the second body region are exposed at the wall face of the recessed part and are in electrical contact through the respective exposed parts.
11. The vertical trench gate transistor semiconductor device of claim 7 , further comprising:
an additional electrode overlaid from the second source region to the gate region with an insulating film interposed,
wherein the additional electrode is in contact with the second source region and the second body region at the wall face of the recessed part.
12. A vertical trench gate transistor semiconductor device comprising:
a drain region;
a first body region formed over the drain region;
a second body region formed over a part of the first body region;
a first source region formed over another part of the first body region;
a second source region formed over the second body region and electrically connected to the first source region;
a trench formed through the first source region and the first body region; and
a gate disposed in the trench;
wherein the second source region functions as an electrical contact for the first source region while the second body region functions as an electrical contact for the first body region,
an upper edge of a wall face of the trench is rounded,
a gate region is formed so as to form a recessed part in an upper part of the trench, and
the second body region is exposed at a wall face of the recessed part and is in electrical contact through the exposed part.
13. The vertical trench gate transistor semiconductor device of claim 12 ,
wherein the first source region and the second source region are exposed at the upper edge of the wall face of the trench, and the first source region and the second source region which are exposed at the upper edge of the wall face of the trench are rounded.
14. The vertical trench gate transistor semiconductor device of claim 12 ,
wherein parts of the wall face of the trench from the upper edge to upper faces of the first source region and the second source region are rounded entirely.
15. The vertical trench gate transistor semiconductor device of claim 14 , further comprising:
an additional electrode overlaid from the first source region and the second source region to the gate region with an insulating film interposed,
wherein the additional electrode is in contact with the second source region and the second body region at the wall face of the recessed part.
16. The vertical trench gate transistor semiconductor device of claim 15 ,
wherein the additional electrode is electrically connected to the first source region and the second source region.
17. The vertical trench gate transistor semiconductor device of claim 12 ,
wherein the second source region is thinner than the first source region.
18. The vertical trench gate transistor semiconductor device of claim 12 ,
wherein the second body region includes a lower portion and an upper portion whose impurity concentration is higher than an impurity concentration of the lower portion, and
the upper portion is exposed at the wall face of the recessed part and is in electrical contact through the exposed part.
19. The vertical trench gate transistor semiconductor device of claim 18 ,
wherein an additional electrode is formed over the gate in the recessed part with an insulating layer interposed, and
the additional electrode is in contact with the upper portion at the wall face of the recessed part.