Angled-wedge chrome-face wall for intensity balance of alternating phase shift mask

1. A method for forming a phase shift mask comprising:

providing a substrate comprising a transparent material having first, second and third regions, the third region being disposed between the first and second regions;

forming a light reducing layer on a first major surface of the substrate:

patterning the light reducing layer to form a patterned light reducing layer having sidewalls defining openings to expose the first and second regions;

processing the patterned light reducing layer to transform the sidewalls of the pattered light reducing layer to angled sidewalls having an angle of less than 90° from a plane of the first major surface of the substrate, wherein the angled sidewalls improve intensity balance of an image formed by light transmitted through the mask.

2. The method of claim 1 wherein the light reducing layer comprising an opaque layer.

3. The method of claim 1 wherein the light reducing layer comprising a half tone layer.

4. The method of claim 1 wherein the sidewall angle is between 30 and 60 degrees.

5. The method of claim 1 which further includes forming a first trench in the first region of the substrate, wherein said first trench extends under the light reducing layer.

6. The method of claim 1 which further includes forming a first trench in said first region and forming a second trench in said second region of the substrate.

7. The method of claim 1 which further includes forming first and second trenches in said first and second regions of the substrate respectively; said first trench and said second trench extend under the light reducing layer.

8. The method of claim 1 which further includes forming first and second openings with open dimensions that are biased smaller or larger from initial design sizes.

9. The method of claim 1 wherein no phase shifting layer is formed over the patterned light reducing layer.