High throughput screening of catalysts using spin resonance
View Patent ↗High throughput screening of catalyst libraries may be performed using spin resonance techniques, and an evanescent wave probe developed by the present inventors. The probe may operate using either nuclear magnetic resonance or electron spin resonance techniques. In one configuration, a scanning evanescent wave spin resonance probe is used in conjunction with a library of catalysts or other materials, and localized detection of spin resonance is carried out at each library address. In another configuration, the evanescent wave probe is used in a micro-reactor array assay.
1. An evanescent wave probe configured to detect spin resonance from at least one member of an array of catalysts in a catalyst library, wherein the configuration comprises a resonator having a signal source and a resonance detector, wherein the evanescent wave probe is integrated with a scanning probe microscope to regulate the distance between the evanescent wave probe and the at least one member of the catalyst library.
2. The evanescent wave probe of claim 1 , wherein the spin resonance is electron spin resonance (ESR).
3. The evanescent wave probe of claim 1 , wherein the spin resonance is nuclear magnetic resonance (NMR).
4. An evanescent wave probe configured to detect spin resonance from at least one member of an array of micro-reactors in a micro-reactor library, wherein the configuration comprises a resonator having a signal source and a resonance detector, wherein the evanescent wave probe is integrated with a scanning probe microscope to regulate the distance between the evanescent wave probe and the at least one member of the micro-reactor library.
5. The evanescent wave probe of claim 4 , wherein the spin resonance is electron spin resonance (ESR).
6. The evanescent wave probe of claim 4 , wherein the spin resonance is nuclear magnetic resonance (NMR).
7. The evanescent wave probe of claim 1 , wherein the scanning probe microscope is selected from the group consisting of an atomic microscope and a scanning tunneling microscope.
8. The evanescent wave probe of claim 4 , wherein the scanning probe microscope is selected from the group consisting of an atomic force microscope and a scanning tunneling microscope.