IP Library Granted Patent US 7,208,742
Granted Patent B1
US 7,208,742 · App. 11/300,796 · Granted Apr 24, 2007

X-ray detector with radiation hard photodiode design

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Quick Facts
Patent No.
US 7,208,742
App. No.
11/300,796
Granted
Apr 24, 2007
Kind
B1
Abstract

A photodetector for X-ray applications is disclosed incorporating a photodiode design with reduced leakage at each pixel location. The photodiode is of a reduced surface area and has a peripheral edge of reduced length. The length may be minimized by making the photodiode round. The diode is surrounded by a reflective layer that may act as a contact for the diode. Photons are reflected by the reflective layer back towards the reduced area diode to maintain good sensitivity. The reflective/contact layer may form a capacitor with another contact layer by disposing a dielectric layer therebetween, thereby increasing the effective capacitance of the photodiode.

Claims (29)

1. A photodetector formed of an array of pixels on a substrate and covered by a scintillator, each pixel comprising:

a photodiode configured to receive photons and to deplete a stored charge in response to the received photons; and

a reflective layer disposed around at least a portion of the photodiode to reflect photons incident on the reflective layer towards the photodiode via the scintillator;

wherein the reflective layer is made of a conductive material and is spaced from a contact layer by a dielectric material.

2. The photodetector of claim 1 , wherein the reflective layer and the contact layer form a capacitor for storing charge depleted by receipt of photons by the photodiode.

3. The photodetector of claim 1 , wherein the reflective layer forms a contact of the photodiode coupled to an upper surface of the photodiode.

4. The photodetector of claim 3 , wherein the reflective layer is coupled to the upper surface of the photodiode via at least one tab extending onto the upper surface of the photodiode.

5. The photodetector of claim 1 , further comprising a gate layer substantially surrounding the photodiode to limit leakage of charge from the photodiode.

6. The photodetector of claim 5 , wherein the gate layer is electrically coupled to the reflective layer by a via.

7. The photodetector of claim 1 , wherein each pixel further comprises a field effect transistor coupled to the photodiode and switchable to recharge the photodiode for readout of the charge depleted by receipt of the photons.

8. A photodetector formed of an array of pixels on a substrate and covered by a scintillator, each pixel comprising:

a photodiode configured to receive photons and to deplete a stored charge in response to the received photons;

a conductive contact coupled to the photodiode on a lower side thereof; and

a conductive reflective layer disposed around at least a portion of the photodiode, the conductive reflective layer contacting an upper side of the photodiode to form a contact thereof, and configured to reflect photons incident on the reflective layer towards the photodiode via the scintillator.

9. The photodetector of claim 8 , wherein the conductive reflective layer is separated from the conductive contact by a dielectric layer and forms, with the conductive layer, a capacitor for storing charge depleted by receipt of photons by the photodiode.

10. The photodetector of claim 8 , wherein the photodiode occupies a surface area of from approximately 20% to approximately 60% of a total surface area of each pixel.

11. The photodetector of claim 10 , wherein the conductive reflective layer and the photodiode occupy a combined surface area greater than approximately 60% of a total surface area of each pixel.

12. The photodetector of claim 8 , further comprising a gate layer substantially surrounding the photodiode to limit leakage of charge from the photodiode.

13. The photodetector of claim 12 , wherein the gate layer is electrically coupled to the conductive reflective layer by a via.

14. A photodetector formed of an array of pixels on a substrate and covered by a scintillator, each pixel comprising:

a photodiode configured to receive photons and to deplete a stored charge in response to the received photons;

a conductive contact coupled to the photodiode on a lower side thereof;

a conductive reflective layer disposed around at least a portion of the photodiode, the conductive reflective layer contacting an upper side of the photodiode to form a contact thereof, and configured to reflect photons incident on the reflective layer towards the photodiode via the scintillator; and

a dielectric layer separating the conductive reflective layer from the conductive contact to form a capacitor for storing charge depleted by receipt of photons by the photodiode.

15. The photodetector of claim 14 , wherein the photodiode occupies a surface area of from approximately 20% to approximately 60% of a total surface area of each pixel.

16. The photodetector of claim 15 , wherein the conductive reflective layer and the photodiode occupy a combined surface area greater than approximately 60% of a total surface area of each pixel.

17. The photodetector of claim 14 , further comprising a gate layer substantially surrounding the photodiode to limit leakage of charge from the photodiode.

18. The photodetector of claim 17 , wherein the gate layer is electrically coupled to the conductive reflective layer by a via.

19. The photodetector of claim 14 , wherein each pixel further comprises a field effect transistor coupled to the photodiode and switchable to recharge the photodiode for readout of the charge depleted by receipt of the photons.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2020
From: GENERAL ELECTRIC COMPANY
To: BAKER HUGHES, A GE COMPANY, LLC
Reel/Frame 051733/0574 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2006
From: ZELAKIEWICZ, SCOTT STEPHEN; ALBAGLI, DOUGLAS; HENNESSEY, WILLIAN ANDREW; COUTURE, AARON JUDY
To: GENERAL ELECTRIC COMPANY
Reel/Frame 017428/0473 →