Method of fabricating a display device by using a stepped halftone mask to form a three-step photoresist pattern on a material layer for etching and ashing
View Patent ↗The present application relates to a method of fabricating a display device, including the steps of forming at least one to-be-patterned material layer on a substrate and forming a photo-resist layer on the at least one to-be-patterned material layer, providing a halftone mask including light transmission parts for transmitting light, shielding parts, in which shielding patterns for intercepting the light are formed, and a halftone transmission part, in which a first halftone transmission pattern for transmitting an amount of the light that is less than an amount of an incident light and a second halftone transmission pattern formed on the first halftone transmission pattern for transmitting an amount of the light that is less than the amount of the incident light are formed, exposing the photo-resist layer to the light through the halftone mask, developing the photo-resist layer to form a photo-resist pattern on the at least one to-be-patterned material layer on the subststrate, wherein the photo-resist pattern has three different heights, and patterning the at least one to-be-patterned material layer by an etching process and an ashing process using the photo-resist pattern, and wherein a width of the second halftone transmission pattern is narrower than a width of the first halftone transmission pattern.
1. A method of fabricating a display device, comprising steps of:
forming at least one to-be-patterned material layer on a substrate and forming a photo-resist layer on the at least one to-be-patterned material layer;
providing a halftone mask including light transmission parts for transmitting light, shielding parts, in which shielding patterns for intercepting the light are formed, and a halftone transmission part, in which a first halftone transmission pattern for transmitting an amount of the light that is less than an amount of an incident light and a second halftone transmission pattern formed on the first halftone transmission pattern for transmitting an amount of the light that is less than the amount of the incident light are formed;
exposing the photo-resist layer to the light through the halftone mask;
developing the photo-resist layer to form a photo-resist pattern on the at least one to-be-patterned material layer on the substrate, wherein the photo-resist pattern has three different heights; and
patterning the at least one to-be-patterned material layer by an etching process and an ashing process using the photo-resist pattern, and
wherein a width of the second halftone transmission pattern is narrower than a width of the first halftone transmission pattern.
2. The method according to claim 1 , wherein the photo-resist pattern includes a first photo-resist pattern, a second photo-resist pattern which is lower than the first photo-resist pattern, and a third resist pattern of a border part of the first photo-resist pattern and the second photo-resist pattern which is formed lower than the second photo-resist pattern.