Method and apparatus for improved sensitivity in a mass spectrometer
View Patent ↗In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, at least one ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.
1. A mass spectrometer comprising:
an ion source for generating ions in a high-pressure region;
a vacuum chamber comprising an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber, and an exit aperture for passing ions from the vacuum chamber;
a series of multipole ion guides between the inlet and exit apertures and each of the ion guides in the series having a predetermined cross-section for defining an internal volume, the series comprising at least a first ion guide positioned nearest the inlet aperture and a second ion guide positioned nearest the exit aperture;
a power supply for providing a corresponding RF voltage to each of the ion guides for radially confining the ions within the internal volumes of the ion guides;
wherein the configuration of the inlet aperture and the pressure difference between the ion source and the vacuum chamber provides a supersonic free jet expansion downstream of the inlet aperture, the supersonic free jet expansion comprising a barrel shock of predetermined diameter; and
wherein the cross-section of the first ion guide and the corresponding RF voltage applied to the first ion guide are configured for accepting at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion.
2. The mass spectrometer according to claim 1 , wherein the cross-section of the second ion guide and the corresponding RF voltage applied to the second ion guide are configured for focusing the ions to the dimension of the exit aperture.
3. The mass spectrometer according to claim 2 , wherein the cross-section of the second ion guide and the cross-section of the first ion guide has a relative ratio of less than or equal to 1.
4. The mass spectrometer according to claim 3 , wherein the ratio is less than or equal to 0.6.
5. The mass spectrometer according to claim 1 , wherein the multipole ion guides are selected from a quadrupole ion guide, a hexapole ion guide, an octapole ion guide, and any combination thereof.
6. The mass spectrometer according to claim 1 , wherein each ion guide is a quadrupole ion guide.
7. The mass spectrometer according to claim 1 , wherein the high-pressure region is substantially atmospheric pressure.
8. The mass spectrometer according to claim 7 , wherein the vacuum chamber has a pressure between about 0.1 and 10 torr.
9. The mass spectrometer according to claim 8 , wherein the inlet aperture is circular and has a diameter between about 0.1 and 1 mm.
10. The mass spectrometer according to claim 9 , wherein the cross-section of the first ion guide forms an inscribed circle and has a diameter between about 1 and 8 mm.
11. The mass spectrometer according to claim 1 , wherein the power supply comprises at least two separate power supplies for providing the corresponding RF voltages.
12. The mass spectrometer according to claim 1 , further comprising a mass analyzer receiving ions passed from the vacuum chamber.
13. A mass spectrometer comprising:
an ion source for generating ions in a high-pressure region;
a vacuum chamber comprising an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber, and an exit aperture for passing ions from the vacuum chamber;
a multipole ion guide between the inlet and exit apertures, the ion guide having an entrance cross-section and an exit cross-section for defining an internal volume, wherein the exit cross-section and the entrance cross-section has a relative ratio of less than 1;
a power supply for providing an RF voltage to the ion guide for radially confining the ions within the internal volume of the ion guide;
wherein the configuration of the inlet aperture and the pressure difference between the ion source and the vacuum chamber provides a supersonic free jet expansion downstream of the inlet aperture, the supersonic free jet expansion comprising a barrel shock of predetermined diameter; and
wherein the entrance cross-section is configured for accepting at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion and the exit cross-section is configured for focusing the ions to the exit aperture.
14. The mass spectrometer according to claim 13 , wherein the ratio is less than or equal to 0.4.
15. The mass spectrometer according to claim 13 , wherein the ion guide is selected from a quadrupole ion guide, a hexapole ion guide, and an octapole ion guide.
16. The mass spectrometer according to claim 13 , wherein the ion guide is a quadrupole ion guide.
17. A method for performing mass analysis comprising:
generating ions in a high pressure region;
passing the ions into a vacuum chamber comprising an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber, and an exit aperture for passing ions from the vacuum chamber;
providing a series of multipole ion guides between the inlet and exit apertures, each ion guide in the series having a predetermined cross-section defining an internal volume, the series comprising at least a first ion guide positioned nearest the inlet aperture and a second ion guide positioned nearest the exit aperture;
applying a corresponding RF voltage to each ion guide for radially confining the ions within the internal volume of each ion guide;
wherein the configuration of the inlet aperture and the pressure difference between the high pressure region and the vacuum chamber provides a supersonic free jet expansion downstream of the inlet aperture, the supersonic free jet expansion comprising a barrel shock of predetermined diameter; and
wherein the cross-section of at least a first ion guide in the series and the corresponding RF voltage are configured for accepting at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion.
18. The method for performing mass analysis according to claim 17 , wherein the cross section of at least the second ion guide in the series and the corresponding RF voltage applied thereto are configured for focusing the ions to the dimension of the exit aperture.
19. The method of performing mass analysis according to claim 18 , wherein the cross section of the second ion guide and the cross section of the first ion guide has a relative ratio of less than or equal to 1.
20. The method for performing mass analysis according to claim 19 , wherein the ratio is less than or equal to 0.6.