IP Library Patent Application 11317858
Patent Application
App. No. 11/317,858

Apparatus and method for wet-etching

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Quick Facts
Patent No.
US None
App. No.
11/317,858
Abstract

A wet-etching apparatus ( 20 ) includes a first etching chamber ( 213 ), a second etching chamber ( 215 ), and a cleaning chamber ( 214 ) located between the first and second etching chambers. The wet-etching apparatus includes the cleaning chamber disposed between the first and second etching chambers. After being etched in the first etching chamber and before being conveyed to the second etching chamber, a glass substrate is cleaned, so that the residue thereon is removed. Because no resultant blocks the wet-etching reaction, the glass substrate is etched uniformly. Thus, the quality and the yield of the wet-etching process are improved.

Claims (20)

1 . A wet-etching apparatus, comprising:

a first etching chamber;

a second etching chamber; and

a cleaning chamber located between the first and second etching chambers;

wherein residue produced in the first etching chamber is removed in the cleaning chamber.

2 . The wet-etching apparatus as claimed in claim 1 , further comprising a waiting chamber for holding substrates to be etched.

3 . The wet-etching apparatus as claimed in claim 2 , further comprising a buffering chamber for conveying substrates from the waiting chamber to the first etching chamber.

4 . The wet-etching apparatus as claimed in claim 3 , further comprising a rinsing chamber for rinsing substrates that have been processed in the first and second etching chambers.

5 . The wet-etching apparatus as claimed in claim 4 , further comprising a dry-conveying chamber for conveying the substrates from the rinsing chamber to the waiting chamber.

6 . The wet-etching apparatus as claimed in claim 5 , further comprising a wet-conveying chamber disposed between the second etching chamber and the rinsing chamber.

7 . A wet-etching method, comprising:

wet-etching a substrate a first time;

cleaning the substrate to remove residue from the substrate, the residue being produced in the first etching chamber; and

wet-etching the substrate a second time.

8 . The wet-etching process as claimed in claim 7 , wherein the first wet-etching comprises pre-etching and etching.

9 . The wet-etching process as claimed in claim 7 , wherein the second wet-etching is over-etching.

10 . The wet-etching process as claimed in claim 7 , further comprising rinsing the substrate after etching the substrate a second time.

11 . The wet-etching process as claimed in claim 10 , further comprising drying the substrate after rinsing the substrate.

12 . The wet-etching process as claimed in claim 7 , wherein a high-pressure water column is used to clean the substrate.

13 . The wet-etching process as claimed in claim 7 , wherein a high-pressure water column and a high-density spray are used to rinse the substrate.

Assignments (3)
CHANGE OF NAME Recorded Apr 13, 2014
From: INNOLUX DISPLAY CORPORATION
To: CHIMEI INNOLUX CORPORATION
Reel/Frame 032672/0877 →
CHANGE OF NAME Recorded Apr 13, 2014
From: CHIMEI INNOLUX CORPORATION
To: INNOLUX CORPORATION
Reel/Frame 032672/0897 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 23, 2005
From: OU, CHEN-HSIEN; CHIU, LI-FENG; GAU, SHENG-CHOU; HUANG, JUNG-LUNG
To: INNOLUX DISPLAY CORP.
Reel/Frame 017375/0027 →