IP Library Granted Patent US 7,171,858
Granted Patent B1
US 7,171,858 · App. 11/319,668 · Granted Feb 6, 2007

Semiconductor pressure sensor

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,171,858
App. No.
11/319,668
Granted
Feb 6, 2007
Kind
B1
Abstract

A semiconductor pressure sensor is intended to achieve reduction in size and cost by decreasing the number of terminals and the number of pads. In the semiconductor pressure sensor, in a first mode in which correction data is input to a memory, a voltage input change-over switch and an input/output change-over switch are operated by an input signal from a switch change-over terminal in such a manner that a voltage input terminal and an input/output terminal are connected to a digital circuit, whereas in a second mode in which an electric signal corrected and amplified is output, the voltage input change-over switch is connected to a semiconductor sensor chip by means of an input signal from the switch change-over terminal, and the input/output terminal is connected to a correction and amplification circuit.

Claims (28)

1. A semiconductor pressure sensor comprising:

a semiconductor sensor part for detecting pressure;

an adjustment and control part including a digital circuit with a memory for storing correction data which is used to correct an electric signal from said semiconductor sensor part, and a correction and amplification circuit that corrects and amplifies said electric signal;

an input/output terminal that is connected to an input/output pad mounted on said adjustment and control part for inputting data to said memory and outputting said electric signal corrected and amplified;

a voltage input terminal that is connected to a voltage input pad mounted on said adjustment and control part for impressing a voltage to said memory and inputting a voltage as an operating power supply for said semiconductor sensor part;

a switch change-over terminal that is connected to a switch change-over pad mounted on said adjustment and control part;

a voltage input change-over switch that is connected to said switch change-over pad and said voltage input pad; and

an input/output change-over switch that is connected to said switch change-over pad and said input/output pad;

wherein in a first mode in which said correction data is input to said memory, said voltage input change-over switch and said input/output change-over switch are operated by an input signal from said switch change-over terminal in such a manner that said voltage input terminal and said input/output terminal are connected to said digital circuit; and

in a second mode in which said electric signal corrected and amplified is output, by means of an input signal from said switch change-over terminal, said voltage input change-over switch is connected to said semiconductor sensor part and said input/output terminal is connected to said correction and amplification circuit.

2. The semiconductor pressure sensor as set forth in claim 1 , further comprising:

a clock signal generation circuit that is arranged outside of said adjustment and control part for generating a clock signal which serves as a reference signal for the timing in which data is written into said memory;

a timing signal generation circuit that is arranged outside of said adjustment and control part for generating an input/output timing signal which serves as a trigger signal for the reading and writing of said correction data;

a clock change-over switch that is arranged in said adjustment and control part and is connected to said clock signal generation circuit; and

a timing change-over switch that is arranged in said adjustment and control part and is connected to said timing signal generation circuit;

wherein in said first mode in which said correction data is input to said memory, said clock change-over switch and said timing change-over switch are operated in such a manner that said clock signal generation circuit and said timing signal generation circuit are electrically connected to said digital circuit, respectively; and

in said second mode in which said electric signal corrected and amplified is output, said clock change-over switch and said timing change-over switch are operated in such a manner that said semiconductor sensor part is connected to said correction and amplification circuit.

3. The semiconductor pressure sensor as set forth in claim 1 , wherein said semiconductor sensor part is composed of a semiconductor sensor chip, and said adjustment and control part is composed of a semiconductor adjustment chip.

4. The semiconductor pressure sensor as set forth in claim 1 , wherein said semiconductor sensor part and said adjustment and control part are composed of an IC that is formed on one and the same chip.

5. A semiconductor pressure sensor comprising:

a semiconductor sensor part for detecting pressure;

an adjustment and control part including a digital circuit with a memory for storing correction data which is used to correct an electric signal from said semiconductor sensor part, and a correction and amplification circuit that corrects and amplifies said electric signal;

a clock signal generation circuit that is arranged outside of said adjustment and control part for generating a clock signal which serves as a reference signal for the timing in which data is written into said memory;

a timing signal generation circuit that is arranged outside of said adjustment and control part for generating an input/output timing signal which serves as a trigger signal for the reading and writing of said correction data;

a clock change-over switch that is arranged in said adjustment and control part and is connected to said clock signal generation circuit; and

a timing change-over switch that is arranged in said adjustment and control part and is connected to said timing signal generation circuit;

wherein in said first mode in which said correction data is input to said memory, said clock change-over switch and said timing change-over switch are operated in such a manner that said clock signal generation circuit and said timing signal generation circuit are electrically connected to said digital circuit, respectively; and

in said second mode in which said electric signal corrected and amplified is output, said clock change-over switch and said timing change-over switch are operated in such a manner that said semiconductor sensor part is connected to said correction and amplification circuit.

Assignments (2)
COMPANY SPLIT Recorded Sep 4, 2024
From: MITSUBISHI ELECTRIC CORPORATION
To: MITSUBISHI ELECTRIC MOBILITY CORPORATION
Reel/Frame 068834/0585 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2005
From: KANATANI, MASAO; TARUYA, MASAAKI; NAKAMURA, HIROSHI
To: MITSUBISHI DENKI KABUSHIKI KAISHA
Reel/Frame 017431/0962 →