System and method for utilizing an autofocus feature in an automated microscope

1. A method for adjusting focus in an automated microscope, the method comprising:

providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels;

designating a region of interest in the array of sensor pixels to emulate a virtual confocal aperture;

directing a light beam to focus and illuminate an object according to a diffraction limited point configured to reject out of focus light thereby forming an image of the illuminated diffraction limited point at the optical detector, wherein the image of the illuminated diffraction limited point substantially overlaps the designated region of interest;

detecting a light intensity from sensor pixels located within the designated region of interest based on the optical detector being configured to have random access capability for selective detection of the light intensity; and

adjusting a relative focal position of an objective lens based on the detected light intensity.

2. The method according to claim 1 , further comprising:

selecting, for image acquisition, the relative focal position that corresponds to a peak in the light intensity detected.

3. The method according to claim 1 , wherein the step of designating the region of interest further comprises:

calibrating the emulated virtual confocal aperture such that a sharpest image of the illuminated pattern, formed at the optical detector, is no smaller than the designated region of interest.

4. The method according to claim 1 , further comprising:

resetting or ignoring sensor pixels that are located outside the designated region of interest.

5. The method according to claim 1 , wherein:

the automated microscope operates in a line-confocal mode; and

the predefined pattern has a shape of a straight line and is centered in a field of view.

6. The method according to claim 1 , wherein the optical detector is selected from a group consisting of:

a CMOS optical detector; and

a CCD camera.

7. The method according to claim 1 , wherein the light beam is dedicated to autofocusing and has a wavelength that is different from a light source employed by the automated microscope for image acquisition.

8. The method according to claim 1 , further comprising:

identifying one or more interfaces on or near the object by detecting changes in the light intensity while adjusting the relative focal position of the objective lens.

9. The method of claim 1 , wherein the diffraction limited point is a diffraction limited line.

10. An automated microscope comprising:

at least one light source that generates a light beam;

an optical path and an optical detector for image acquisition, wherein the optical path has an objective lens therein, and wherein the optical detector comprises an array of sensor pixels;

a motion mechanism capable of moving the objective lens within a focus adjustment range; and

a processor module coupled to the optical detector and the motion mechanism;

wherein:

the processor module designates a region of interest in the array of sensor pixels to emulate a virtual confocal aperture,

the optical path directs the light beam to focus and illuminate an object according to a diffraction limited point configured to reject out of focus light thereby forming an image of the illuminated diffraction limited point at the optical detector, wherein the image of the illuminated diffraction limited point substantially overlaps the designated region of interest, and

the processor module determines a desired relative focal position of the objective lens by coordinating the movement of the objective lens and detection of light intensity from sensor pixels located within the designated region of interest based on the optical detector being configured to have random access capability for selective detection of the light intensity.

11. The automated microscope according to claim 10 , wherein the processor module selects, for image acquisition, the relative focal position that corresponds to a peak in the light intensity detected.

12. The automated microscope according to claim 10 , wherein the processor module calibrates the emulated virtual confocal aperture such that a sharpest image of the illuminated pattern, formed at the optical detector, is no smaller than the designated region of interest.

13. The automated microscope according to claim 10 , wherein the processor module resets or ignores sensor pixels that are located outside the designated region of interest.

14. The automated microscope according to claim 10 , wherein:

the automated microscope operates in a line-confocal mode; and

the predefined pattern has a shape of a straight line.

15. The automated microscope according to claim 10 , wherein:

the automated microscope operates in a point-confocal mode; and

the predefined pattern has a point-like shape.

16. The automated microscope according to claim 10 , wherein:

the automated microscope operates in a wide-field mode; and

the predefined pattern has a point-like shape.

17. The automated microscope according to claim 10 , wherein the optical detector is selected from a group consisting of:

a CMOS optical detector; and

a CCD camera.

18. The automated microscope according to claim 10 , wherein the light beam is generated by an autofocus light source and has a wavelength that is different from a light source employed by the automated microscope for image acquisition.

19. The automated microscope according to claim 10 , wherein the processor module identifies one or more interfaces on or near the object by detecting changes in the light intensity while adjusting the relative focal position of the objective lens.

20. The method of claim 10 , wherein the diffraction limited point is a diffraction limited line.