Non-contact deviation measurement system
View Patent ↗A non-contacting deviation measurement system projects a first line and a second line upon a surface of an object. The projections of the first line and second line are arranged to overlap at an intersection line oriented at a nominal location such that when the surface is oriented at the nominal location, the intersection line appears on the surface. As the location of the surface deviates from the nominal location, the first line and second line as projected upon the surface move away from one another. The distance between the lines may be used to calculate the deviation from the nominal location. The deviation calculated may be compared to a predetermined maximum allowable deviation.
1. A deviation measuring system comprising:
a first projector arranged to project a first line and a second projector arranged to project a second line, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
an optical sensor positioned to capture an image of the projections of the first line and the second line upon a surface of an object; and
analysis software to analyze the image, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein the system is capable of calculating said deviation both when said surface is above said nominal location, and when said surface is below said nominal location.
2. The deviation measuring system of claim 1 , wherein the first projector and the second projector are focused at the intersection line.
3. The deviation measuring system of claim 1 , wherein the deviation is calculated using a distance a between the first line and the second line as projected onto the surface.
4. The deviation measuring system of claim 3 , wherein the distance a comprises an average distance between the first line and the second line in an analysis area of the image.
5. The deviation measuring system of claim 4 , wherein a dimension of the analysis area is equal to or greater than a diameter of the object.
6. The deviation measuring system of claim 4 , wherein the object comprises a propellant column, and a dimension of the analysis area is equal to approximately 4 times the grain size of the propellant.
7. The deviation measuring system of claim 3 , wherein the deviation is calculated using an angle φ between the projections of the first line and the second line, according to the following formula:
deviation
=
a
cot
(
φ
2
)
2
.
8. The deviation measuring system of claim 1 , wherein the object is supported by a tray and the distance between the first line and the second line as projected upon the tray is used to verify the nominal location of the intersection line; the distance being greater than zero.
9. The deviation measuring system of claim 1 , wherein the surface is nonplanar.
10. The deviation measuring system of claim 1 , wherein the object comprises a powder.
11. The deviation measuring system of claim 10 , wherein the powder is propellant.
12. The deviation measuring system of claim 1 , wherein the intersection line is horizontal.
13. The deviation measuring system of claim 1 , wherein a vertical axis intersects the intersection line, and the projection of the first line is oriented at an angle to the vertical axis such that the first line is located to a first side of the vertical axis at locations above the intersection line and located to a second side of the vertical axis at locations below the intersection line.
14. The deviation measuring system of claim 13 , wherein the projection of the second line is oriented at an angle to the vertical axis such that the second line is located to the second side of the vertical axis at locations above the intersection line and located to the first side of the vertical axis at locations below the intersection line.
15. The deviation measuring system of claim 1 , further comprising a third projector projecting a third line, the third line oriented perpendicular to the intersection line, the position of the third line as projected on the surface of the object indicating whether the upper surface is above or below the nominal location.
16. The deviation measuring system of claim 1 , wherein the system calculates said deviation both when said surface is above said nominal location, and when said surface is below said nominal location.
17. A deviation measuring system comprising:
a first projector projecting a first line and a second projector projecting a second line, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
an optical sensor positioned to capture an image of the projections of the first line and the second line upon a surface of an object; and
analysis software to analyze the image, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein the deviation is calculated using a distance a between the first line and the second line as projected onto the surface, and an angle φ between the projections of the first line and the second lines according to the following formula:
deviation
=
a
cot
(
φ
2
)
2
.
18. The deviation measuring system of claim 17 , wherein the angle φ between the projections of the first line and the second line falls within a range of 10 degrees to 170 degrees.
19. A method comprising:
providing a propellant column;
providing a first projector for projecting a first line and a second projector for projecting a second line, the first projector and the second projector oriented such that the first line overlaps the second line at an intersection line, the intersection line oriented at a nominal height;
projecting the first line and the second line onto a surface of the propellant column;
measuring an average distance between the first line and the second line as projected onto the surface of the propellant column; and
calculating a height deviation between the nominal height and the surface of the propellant column using the average distance measured and an intersection angle between the projection of the first line and the projection of the second line.
20. The method of claim 19 , wherein the step of measuring an average distance between the first line and the second line as projected onto the surface of the propellant column further comprises providing an optical sensor, capturing an image of the projections of the first line and the second line upon the surface of the propellant column and analyzing the image to determine the average distance.
21. The method of claim 19 , wherein the step of calculating a height deviation further comprises providing a processor and software to perform the calculation.
22. The method of claim 19 , further comprising whether the calculated height deviation falls within a predetermined maximum acceptable height deviation.