Acquiring test data from an electronic circuit
View Patent ↗Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.
1. A method for acquiring test data from an electronic circuit, the method comprising:
mounting a probe adjacent to a capture point on an electronic circuit board, the electronic circuit board having an electronic circuit;
synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes, including providing from a remote device through the data communications connection to such synchronized probes a synchronization clock signal;
capturing by the probe an electronic signal of the electronic circuit, including measuring a voltage level;
digitizing by the probe the captured signal;
storing by the probe the digitized signal in the probe;
processing by the probe the digitized signal;
transmitting by the probe the digitized signal from the probe through a data communications connection to the remote device;
receiving in the remote device through the data communications connection digitized signals captured and transmitted from two or more such synchronized probes;
synchronizing by the remote device the received signals for display; and
displaying by the remote device the synchronized signals.
2. A system for acquiring test data from an electronic circuit, the system comprising a probe mounted adjacent to a capture point on the electronic circuit board, the electronic circuit board having an electronic circuit, the probe having a computer processor and a computer memory operatively coupled to the computer processor, the computer memory having disposed within it computer program instructions capable of:
synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes, including providing from a remote device through the data communications connection to such synchronized probes a synchronization clock signal;
capturing by the probe an electronic signal of the electronic circuit, including measuring a voltage level;
digitizing by the probe the captured signal; and
storing by the probe the digitized signal in the probe;
processing by the probe the digitized signal;
transmitting by the probe the digitized signal from the probe through a data communications connection to the remote device;
wherein the remote device comprises a computer processor and a computer memory operatively coupled to the computer processor, the computer memory of the remote device having disposed within it computer program instructions capable of:
receiving in the remote device through the data communications connection digitized signals captured and transmitted from two or more such synchronized probes;
synchronizing by the remote device the received signals for display; and
displaying by the remote device the synchronized signals.