IP Library Granted Patent US 7,514,785
Granted Patent B2
US 7,514,785 · App. 11/337,687 · Granted Apr 7, 2009

Semiconductor device and manufacturing method thereof

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Quick Facts
Patent No.
US 7,514,785
App. No.
11/337,687
Granted
Apr 7, 2009
Kind
B2
Abstract

A semiconductor device includes a solder dam for restricting the flow of solder during manufacturing. The device includes a semiconductor chip bonded to a first side of a circuit board, a metal base for dissipating heat produced by the semiconductor chip, the metal base being bonded to a second side of the circuit board, and a dam material disposed on the metal base in a predetermined pattern for restricting the flow of solder used in bonding a plurality of the circuit boards to the metal base. By employing the solder dam, solderability is not impaired, device contamination can be avoided, and a highly reliable semiconductor device can be produced.

Claims (22)

1. A semiconductor device comprising:

a plurality of circuit boards, each circuit board having a first side and a second side;

semiconductor chips bonded to the first sides of the circuit boards;

a metal base for dissipating heat produced by the semiconductor chips, the metal base being bonded to the second sides of the circuit boards; and

a dam material disposed on the metal base for restricting flow of a solder used for bonding the plurality of the circuit boards to the metal base, said dam material being arranged on the metal base to prevent the solder from flowing from one circuit board to another circuit board.

2. A semiconductor device according to claim 1 , wherein said dam material is a painted material disposed in a predetermined pattern.

3. A semiconductor device comprising:

a circuit board;

a semiconductor chip bonded to a first side of the circuit board;

a metal base for dissipating heat produced by the semiconductor chip, the metal base being bonded to a second side of the circuit board; and

a dam material disposed on the metal base for restricting flow of a solder used in bonding a plurality of the circuit boards to the metal base,

wherein said dam material is a painted material disposed in a predetermined pattern, and the dam material comprises as a main component an inorganic substance having a high solder heat resistance.

4. A semiconductor device according to claim 3 , wherein the dam material comprises a mixture of particles of the inorganic substance and a volatile binder.

5. A semiconductor device according to claim 3 , wherein the inorganic substance is carbon or a ceramic.

6. A semiconductor device comprising:

a circuit board;

a semiconductor chip bonded to a first side of the circuit board;

a metal base for dissipating heat produced by the semiconductor chip, the metal base being bonded to a second side of the circuit board; and

a dam material disposed on the metal base for restricting flow of a solder used in bonding a plurality of the circuit boards to the metal base,

wherein said dam material comprises as a main component a material selected from the group consisting of a carbon, a ceramic, and metal with low solder wetting characteristics.

7. A semiconductor device according to claim 1 , wherein the dam material protrudes from the metal base to separate the circuit boards situated adjacent to each other.

8. A semiconductor device according to claim 7 , wherein the dam material is located outside the circuit boards and extends linearly continuously.

Assignments (3)
MERGER AND CHANGE OF NAME Recorded Aug 26, 2011
From: FUJI ELECTRIC SYSTEMS CO., LTD. (FES); FUJI TECHNOSURVEY CO., LTD. (MERGER BY ABSORPTION)
To: FUJI ELECTRIC CO., LTD.
Reel/Frame 026970/0872 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2010
From: FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
To: FUJI ELECTRIC SYSTEMS CO., LTD.
Reel/Frame 024252/0438 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2006
From: TOBA, SUSUMU; MOROZUMI, AKIRA; FURIHATA, KAZUO
To: FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
Reel/Frame 017754/0511 →