IP Library Granted Patent US 7,623,231
Granted Patent B2
US 7,623,231 · App. 11/353,107 · Granted Nov 24, 2009

Device for Raman spectroscopy and Raman spectroscopic apparatus

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Quick Facts
Patent No.
US 7,623,231
App. No.
11/353,107
Granted
Nov 24, 2009
Kind
B2
Abstract

A device for Raman spectroscopy comprises a fine structure body provided with an array structure region, in which a plurality of recess areas having approximately identical shapes, as viewed from above, are arrayed regularly at approximately identical pitches. A surface of the fine structure body on the side of the array structure region acts as a light scattering surface. The fine structure body may be constituted of an un-anodized part of a metal body to be subjected to anodic oxidation processing, the un-anodized part remaining after a processing, wherein the anodic oxidation processing is performed on the metal body, a part of the metal body being thereby converted into a metal oxide layer, and wherein the metal oxide layer is removed from the metal body, has been performed.

Claims (25)

1. A device for Raman spectroscopy, which is adapted for use in Raman spectroscopy for separating scattered light into its spectral components and detecting Raman scattered light, and which is provided with a light scattering surface for scattering incident light, wherein:

the device for Raman spectroscopy comprises a fine structure body provided with an array structure region, in which a plurality of recess areas having approximately identical shapes, as viewed from above, are arrayed regularly at approximately identical pitches,

a surface of the fine structure body on the side of the array structure region acts as the light scattering surface, and

the entire light scattering surface is a metal surface.

2. A device for Raman spectroscopy as defined in claim 1 wherein a Raman scattering boosting substance, which exhibits a Raman scattering intensity higher than the Raman scattering intensity of a constituent material of the array structure region, is fixed to the array structure region side of the fine structure body.

3. A device for Raman spectroscopy as defined in claim 1 , wherein the fine structure body is formed from a metal body that contains aluminum as a principal constituent, and

the recess areas have approximately regular hexagon shapes, as viewed from above, and are arrayed so as to stand close to one another.

4. A device for Raman spectroscopy as defined in claim 3 ,

wherein the fine structure body is formed by:

performing anodic oxidation processing on the metal body, wherein a part of the metal body is converted into a metal oxide layer, and

removing the metal oxide layer from the metal body.

5. A device for Raman spectroscopy as defined in claim 3 ,

wherein the fine structure body is formed by:

performing anodic oxidation processing on the metal body, wherein a part of the metal body is converted into a metal oxide layer,

removing a part of the metal oxide layer, and

coating an uneven surface formed on the remaining part of the metal oxide layer with a metal.

6. A Raman spectroscopic apparatus, comprising:

i) a device for Raman spectroscopy as defined in claim 1 ,

ii) light irradiating means for irradiating light, which has a specific wavelength, to the light scattering surface of the device for Raman spectroscopy, and

iii) spectroscopic means for separating the scattered light, which occurs at the light scattering surface, into spectral components of the scattered light, and obtaining a spectrum of Raman scattered light.

7. A method for producing a device for Raman spectroscopy, which is adapted for use in Raman spectroscopy for separating scattered light into its spectral components and detecting Raman scattered light, and which is provided with a light scattering surface for scattering incident light, the method comprising:

performing anodic oxidation processing on a metal body, comprising converting a part of the metal body into a metal oxide layer;

removing a part of the metal oxide layer from the metal body; and

coating an uneven surface formed on the remaining part of the metal oxide layer with a metal.

8. A device for Raman spectroscopy as defined in claim 1 , wherein the metal surface is formed on a dielectric material.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2007
From: FUJIFILM HOLDINGS CORPORATION (FORMERLY FUJI PHOTO FILM CO., LTD.)
To: FUJIFILM CORPORATION
Reel/Frame 018904/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2006
From: TOMARU, YUICHI
To: FUJI PHOTO FILM CO., LTD.
Reel/Frame 017572/0952 →