Probe for tunable laser Raman spectroscopy system
View Patent ↗A probe of a Raman spectroscopy system has a wavelength and/or amplitude referencing system for determining a wavelength of the excitation signal. Preferably, this referencing system is near an output aperture, through which the excitation signal is transmitted to the sample. In this way, any birefringence or polarization dependent loss (PDL) that may be introduced by optical elements in the system can be compensated for since the wavelength reference system will detect the effect or impact of these elements.
1. A probe subsystem for a Raman spectroscopy system, the probe subsystem comprising:
a wavelength reference system that receives an excitation signal from a semiconductor source subsystem, the wavelength reference system determining a wavelength of the excitation signal, including:
at least one reference detector for detecting a portion of the excitation signal prior to excitation of a sample to determine a wavelength of the excitation signal, and
a wavelength reference element for filtering the excitation signal received by the at least one reference detector; and
an output aperture through which the excitation signal is transmitted to the sample; and
separation optics for enabling transmission of the excitation signal to the sample and receipt of a spectroscopic Raman response from the sample along a common axis extending through the output aperture.
2. A probe subsystem as claimed in claim 1 , wherein the wavelength reference system further comprises:
a second reference detector; and
a partial reflector for dividing the excitation signal between the first reference detector and the second reference detector; and
the wavelength reference element filtering the excitation signal received by the first reference detector and the second reference detector.
3. A probe subsystem as claimed in claim 2 , further comprising a controller that uses the responses of the first reference detector and the second reference detector to determine the wavelength and a power of the excitation signal.
4. A probe subsystem as claimed in claim 1 , further comprising a partially reflective mirror in a path of the excitation signal for tapping the portion of the excitation signal received by the wavelength reference system.
5. A probe subsystem as claimed in claim 4 , further comprising excitation optics for shaping a beam of the semiconductor laser excitation signal after detection of the portion of the excitation signal by the wavelength reference system.
6. A probe subsystem as claimed in claim 1 , wherein the separation optics comprises a mirror for reflecting light from the sample, the mirror comprising an optical port through which the excitation signal is transmitted to the sample.
7. A probe subsystem as claimed in claim 1 , wherein the probe subsystem receives the excitation signal from a semiconductor tunable laser subsystem through an optical fiber.
8. A probe subsystem as claimed in claim 7 , further comprising at least one amplified spontaneous emission filter for attenuating amplified spontaneous emission in the excitation signal after receipt from the optical fiber.
9. A probe subsystem as claimed in claim 7 , further comprising at least one polarizer for improving a polarization of the excitation signal after receipt from the optical fiber.
10. A probe subsystem as claimed in claim 1 , further comprising at least one polarizer for improving a polarization of the excitation signal.
11. A probe subsystem as claimed in claim 1 , wherein the probe subsystem receives the excitation signal from a semiconductor tunable laser subsystem through a polarization maintaining optical fiber.
12. A Raman spectroscopy system, comprising:
a tunable laser excitation subsystem comprising at least one tunable semiconductor diode for generating an excitation signal;
a probe subsystem comprising:
a wavelength reference system for determining a wavelength of the excitation signal comprising at least one reference detector for detecting a portion of the excitation signal prior to excitation of the sample and a wavelength reference element for filtering the excitation signal received by the reference detector; and
an output aperture through which the excitation signal is transmitted to a sample; and
a spectrometer subsystem for resolving a spectrum of light returning from the sample; and
a controller for determining a Raman spectral response of the sample in response to the spectrum of light resolved by the spectrometer subsystem and the wavelength of the excitation signal from the wavelength reference system.
13. A system as claimed in claim 12 , wherein the wavelength reference system comprises:
a first reference detector for detecting a portion excitation signal prior to excitation of the sample;
a second reference detector for detecting a portion excitation signal prior to excitation of the sample;
a partial reflector for dividing the excitation signal between the first reference detector and the second reference detector; and
a wavelength reference element for filtering the excitation signal received by the first reference detector and the second reference detector.
14. A system as claimed in claim 13 , wherein the controller uses the responses of the first reference detector and the second reference detector to determine the wavelength and a power of the excitation signal.
15. A system as claimed in claim 12 , wherein the probe subsystem comprises separation optics for enabling transmission of the excitation beam to the sample and receipt of the light from the sample along a common axis extending through the output aperture.
16. A system as claimed in claim 12 , further comprising a fiber pigtail for transmitting the excitation signal from the semiconductor tunable laser subsystem to the probe subsystem.
17. A system as claimed in claim 12 , wherein the probe subsystem comprises at least one polarizer for improving a polarization of the excitation signal.
18. A system as claimed in claim 12 , further comprising polarization maintaining fiber for transmitting the excitation signal from the semiconductor tunable laser subsystem to the probe subsystem.