IP Library Granted Patent US 7,440,248
Granted Patent B2
US 7,440,248 · App. 11/358,045 · Granted Oct 21, 2008

Semiconductor integrated circuit device

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Quick Facts
Patent No.
US 7,440,248
App. No.
11/358,045
Granted
Oct 21, 2008
Kind
B2
Abstract

A semiconductor integrated circuit device includes: a protected circuit protected against electro-static discharge applied from outside the device; an SCR protection circuit having an anode terminal connected to a power line, a cathode terminal connected to a ground line and a trigger terminal; and a trigger circuit connected to the trigger terminal and including an RC circuit connected between the power line and the ground line.

Claims (69)

1. A semiconductor integrated circuit device comprising:

a protected circuit protected against electro-static discharge applied from outside the device;

an SCR protection circuit having:

a pnp bipolar transistor including an emitter connected to a power line and a collector connected to a trigger terminal;

an npn bipolar transistor including an emitter connected to a ground line, a collector connected to a base of the pnp bipolar transistor, and a base connected to the trigger terminal;

a first resistor having one terminal connected to the trigger terminal and the other terminal connected to the ground line; and

a second resistor having one terminal connected to the power line and the other terminal connected to the collector of the npn bipolar transistor; and

a trigger circuit connected to the trigger terminal and including an RC circuit connected between the power line and the ground line, the RC circuit having a fourth resistor and a capacitor; and

a third resistor having one terminal connected to the trigger terminal and the trigger circuit and the other terminal connected to the ground line,

wherein the trigger circuit includes:

a p-transistor having one terminal connected to the power line and another terminal connected to the trigger terminal and the one terminal of the third resistor;

a NAND gate having an output terminal connected to a gate of the p-transistor;

the capacitor having one terminal connected to the power line and another terminal connected to a first input terminal of the NAND gate;

the fourth resistor having one terminal connected to the first input terminal of the NAND gate and the other terminal connected to the ground line; and

an inverter having an input terminal connected to the trigger terminal and an output terminal connected to a second input terminal of the NAND gate.

2. A semiconductor integrated circuit device of comprising:

a protected circuit protected against electro-static discharge applied from outside the device;

an SCR protection circuit having:

a pnp bipolar transistor including an emitter connected to a power line and a collector connected to a trigger terminal;

an npn bipolar transistor including an emitter connected to a ground line, a collector connected to a base of the pnp bipolar transistor, and a base connected to the trigger terminal;

a first resistor having one terminal connected to the trigger terminal and the other terminal connected to the ground line; and

a second resistor having one terminal connected to the power line and the other terminal connected to the collector of the npn bipolar transistor; and

a trigger circuit connected to the trigger terminal and including an RC circuit connected between the power line and the ground line, the RC circuit having a fourth resistor and a capacitor; and

a third resistor having one terminal connected to the trigger terminal and the trigger circuit and the other terminal connected to the ground line, wherein the trigger circuit includes:

an n-transistor having one terminal connected to the power line and another terminal connected to the trigger terminal and the one terminal of the third resistor;

a NOR gate having an output terminal connected to a gate of the n-transistor;

the capacitor having one terminal connected to the ground line and another terminal connected to a first input terminal of the NOR gate; the fourth resistor having one terminal connected to the first input terminal of the NOR gate and the other terminal connected to the power line;

and a buffer having an input terminal connected to the trigger terminal and an output terminal connected to a second input terminal of the NOR gate.

3. A semiconductor integrated circuit device comprising:

a protected circuit protected against electro-static discharge applied from outside the device;

an SCR protection circuit having:

an npn bipolar transistor including an emitter connected to a ground line and a collector connected to a trigger terminal;

a pnp bipolar transistor including an emitter connected to a power line, a collector connected to a base of the npn bipolar transistor, and a base connected to the trigger terminal;

a first resistor having one terminal connected to the trigger terminal and the other terminal connected to the power line; and

a second resistor having one terminal connected to the ground line and the other terminal connected to the collector of the pnp bipolar transistor; and

a trigger circuit connected to the trigger terminal and including an RC circuit connected between the power line and the ground line, the RC circuit having a fourth resistor and a capacitor; and

a third resistor having one terminal connected to the trigger terminal and the trigger circuit and the other terminal connected to the power line,

wherein the trigger circuit includes:

a p-transistor having one terminal connected to the ground line and another terminal connected to the trigger terminal and the one terminal of the third resistor;

a NAND gate having an output terminal connected to a gate of the p-transistor;

the capacitor having one terminal connected to the power line and another terminal connected to a first input terminal of the NAND gate;

the fourth resistor having one terminal connected to the first input terminal of the NAND gate and the other terminal connected to the ground line; and a buffer having an input terminal connected to the trigger terminal and an output terminal connected to a second input terminal of the NAND gate.

4. A semiconductor integrated circuit device comprising:

a protected circuit protected against electro-static discharge applied from outside the device;

an SCR protection circuit having:

an npn bipolar transistor including an emitter connected to a ground line and a collector connected to a trigger terminal;

a pnp bipolar transistor including an emitter connected to a power line, a collector connected to a base of the npn bipolar transistor, and a base connected to the trigger terminal;

a first resistor having one terminal connected to the trigger terminal and the other terminal connected to the power line; and

a second resistor having one terminal connected to the ground line and the other terminal connected to the collector of the pnp bipolar transistor; and

a trigger circuit connected to the trigger terminal and including an RC circuit connected between the power line and the ground line, the RC circuit having a fourth resistor and a capacitor; and

a third resistor having one terminal connected to the trigger terminal and the trigger circuit and the other terminal connected to the power line,

wherein the trigger circuit includes:

an n-transistor having one terminal connected to the ground line and another terminal connected to the trigger terminal and the one terminal of the third resistor;

a NOR gate having an output terminal connected to a gate of the n-transistor;

the capacitor having one terminal connected to the ground line and another terminal connected to a first input terminal of the NOR gate;

the fourth resistor having one terminal connected to the first input terminal of the NOR gate and the other terminal connected to the power line; and

an inverter having an input terminal connected to the trigger terminal and an output terminal connected to a second input terminal of the NOR gate.

5. The device of claim 1 , comprising a pn diode connected in parallel with the protected circuit and having a cathode connected to the power line and an anode connected to the ground line.

6. The device of claim 1 , comprising an nMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line and a gate connected to the ground line via a fifth resistor.

7. The device of claim 1 , comprising a pMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line and a gate connected to the power line via a fifth resistor.

8. The device of claim 3 , comprising a pn diode connected in parallel with the protected circuit and having a cathode connected to the power line and an anode connected to the ground line.

9. The device of claim 3 , comprising an nMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line, and a gate connected to the ground line via a fifth resistor.

10. The device of claim 3 , comprising a pMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line, and a gate connected to the power line via a fifth resistor.

11. The device of claim 2 , comprising a pn diode connected in parallel with the protected circuit and having a cathode connected to the power line and an anode connected to the ground line.

12. The device of claim 2 , comprising an nMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line and a gate connected to the ground line via a fifth resistor.

13. The device of claim 2 , comprising a pMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line and a gate connected to the power line via a fifth resistor.

14. The device of claim 4 , comprising a pn diode connected in parallel with the protected circuit and having a cathode connected to the power line and an anode connected to the ground line.

15. The device of claim 4 , comprising an nMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line, and a gate connected to the ground line via a fifth resistor.

16. The device of claim 4 , comprising a pMOS transistor connected in parallel with the protected circuit and having one terminal connected to the power line, another terminal connected to the ground line, and a gate connected to the power line via a fifth resistor.

Assignments (2)
CHANGE OF NAME Recorded Mar 18, 2020
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 052184/0943 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2006
From: ARAI, KATSUYA; KOUGAMI, TOSHIHIRO; KAMEI, MASAYUKI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 018547/0273 →