IP Library Granted Patent US 7,296,478
Granted Patent B2
US 7,296,478 · App. 11/366,411 · Granted Nov 20, 2007

Master carrier for magnetic transfer, inspecting method thereof, and magnetic recording medium producing method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,296,478
App. No.
11/366,411
Granted
Nov 20, 2007
Kind
B2
Abstract

In a master carrier for magnetic transfer which comprises a support that has a transfer-recording pattern arrayed in the track direction thereof in accordance with the information to be transferred to a magnetic recording medium, and a magnetic layer formed on the transfer-recording pattern of the support, the in-plane distance L (mm) between the hill and the valley of the warped master carrier, the vertical-direction distance H (μm) between the two, and the thickness d (mm) of the master carrier are so defined that they satisfy a relation of 0.05≦H·d 3 /L≦0.6.

Claims (13)

1. A method for inspecting a master carrier for magnetic transfer, said master carrier comprising:

a support having a transfer-recording pattern arrayed in a track direction of said master carrier in accordance with information to be transferred to a magnetic recording medium;

a magnetic layer on said transfer-recording pattern of said support; and

a disk surface having a hill and a valley, which result from a warp of said master carrier,

the method comprising the steps of:

measuring an in-plane distance between a top of said hill and a bottom of said valley with respect to said disk surface, and a vertical-direction distance between the top of said hill and the bottom of said valley with respect to said disk surface; and

judging whether said master carrier is good or not based on a relation of said in-plane distance, said vertical-direction distance, and the thickness of said master carrier,

wherein the step of judging is based on whether or not said in-plane distance L (mm) between the top of said hill and the bottom of said valley, said vertical-direction distance H (μm) between the top of said hill and the bottom of said valley to said disk surface, and said thickness d (mm) of said master carrier satisfy the following formula:

0.05≦H·d 3 /L≦0.6.

2. The method for inspecting as claimed in claim 1 , comprising the steps of:

rotating said master carrier around a center axis of said master carrier;

measuring said vertical-direction distance to said disk surface of said master carrier by an optical length-measuring device that is disposed opposite to said disk surface of said master carrier, said optical length-measuring device being moved to a radical direction of said master carrier in parallel to said disk surface of said master carrier; and

determining said in-plane distance between the top of said hill and the bottom of said valley, and said vertical-direction distance to said disk surface, said in-plane distance and said vertical-direction being derived from a vertical height distribution measured.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2007
From: FUJIFILM HOLDINGS CORPORATION (FORMERLY FUJI PHOTO FILM CO., LTD.)
To: FUJIFILM CORPORATION
Reel/Frame 018904/0001 →