IP Library Granted Patent US 7,501,617
Granted Patent B2
US 7,501,617 · App. 11/374,093 · Granted Mar 10, 2009

Device for testing a light-emitting optical device using a socket

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Quick Facts
Patent No.
US 7,501,617
App. No.
11/374,093
Granted
Mar 10, 2009
Kind
B2
Abstract

A tester according to the present invention can conduct a test on optical devices each having a different positional relation between a position of a contact face of an external contact terminal and a direction of light emitted from a semiconductor laser element.

Claims (48)

1. A tester for an optical device, comprising:

a first board;

a socket mounted on said first board, for having an optical device thereon, said socket comprising a base and a cover;

said socket base comprising a terminal for contacting an external connection terminal of such optical device and having a through hole for allowing light emitted from the optical device to pass therethrough, and the socket base holding an optical filter at a midpoint of the through hole, between the optical device and the light receiving element; and

a light receiving element mounted on a top face of the first board at a position corresponding to the through hole of the socket;

wherein the socket base has a second optical filter located on a side portion of the top face thereof, and the first board has a second light receiving element mounted thereon.

2. The tester for an optical device according to claim 1 , wherein the socket base has a groove therein for holding therein the second optical filter in detachable manner.

3. The tester for an optical device according to claim 1 , wherein the cover comprises a third light receiving element and a third optical filter, each located at a position corresponding to the through hole.

4. The tester for an optical device according to claim 2 , wherein the cover comprises a third light receiving element and a third optical filter, each located at a position corresponding to the through hole.

5. A tester for an optical device, comprising:

a first board;

a socket mounted on said first board, for having an optical device thereon, said socket comprising a base and a cover;

said socket base comprising a terminal for contacting an external connection terminal of such optical device and having a through hole for allowing light emitted from the optical device to pass therethrough, and the socket base holding an optical filter at a midpoint of the through hole, between the optical device and the light receiving element; and

a light receiving element mounted on a top face of the first board at a position corresponding to the through hole of the socket;

wherein the socket base has a second optical filter and a second board each placed on a side portion of the top face thereof, the second board has a second light receiving element mounted thereon, and the socket base has a groove therein for holding therein the second optical filter and the second board in a detachable manner.

6. The tester for an optical device according to claim 5 , wherein the cover comprises a third light receiving element and a third optical filter, each located at a position corresponding to the through hole.

7. The tester for an optical device according to claim 5 , wherein the first board and the second board are electrically connected to each other.

8. A tester for an optical device, comprising:

a first board;

a socket mounted to the first board, for having an optical device thereon, said socket comprising a base and a cover;

said socket base comprising a terminal on its top surface, for contacting an external terminal of an optical device;

said socket base further comprising a groove in a side portion of a top surface of said base;

a second board detachably held in said groove;

a light receiving element mounted on said second board, for measuring an output of light emitted from the optical device; and

an optical filter located between the optical device and the light receiving element and detachably held in said groove.

9. The tester for an optical device according to claim 8 , wherein the cover comprises a second light receiving element and a second optical filter.

10. The tester for an optical device according to claim 8 , wherein the first board and the second board are electrically connected to each other.

11. A tester for an optical device, comprising;

a first board;

a socket mounted on said first board, for having an optical device thereon, said socket comprising a base and a cover;

said socket base comprising a terminal for contacting an external connection terminal of such optical device and having a through hole for allowing light emitted from the optical device to pass therethrough, and the socket base holding an optical filter at a midpoint of the through hole, between the optical device and the light receiving element; and

a light receiving element mounted on a top face of the first board at a position corresponding to the through hole of the socket;

wherein the cover comprises a second light receiving element and a second optical filter, each located at a position corresponding to the through hole.

12. A tester for an optical device, comprising;

a first board;

a socket mounted on said first board, for having an optical device thereon, said socket comprising a base and a cover;

a top surface of said socket base comprising a terminal for contacting an external connection of such optical device;

a light receiving element mounted on the first board and located at a side portion of the top surface of said socket base for measuring an output of light emitted from the optical device; and

an optical filter located between the optical device and the light receiving element at a side portion of the top surface of the socket base,

wherein the cover comprises a second light receiving element and a second optical filter.

13. A tester for an optical device, comprising;

a first board;

a socket mounted on said first board, for having an optical device thereon, said socket comprising a base and a cover;

a top surface of said socket base comprising a terminal for contacting an external connection of such optical device;

a light receiving element mounted on the first board and located at a side portion of the top surface of said socket base for measuring an output of light emitted from the optical device; and

an optical filter located between the optical device and the light receiving element at a side portion of the top surface of the socket base,

wherein the socket base has a groove therein for holding therein the optical filter in a detachable manner, and

the cover comprises a second light receiving element and a second optical filter.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 052755/0917 →
CHANGE OF NAME Recorded Nov 3, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021779/0851 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2006
From: HAYAMI, ISAO; NISHIKAWA, TORU; TATEYANAGI, MASAYA; TANAKA, SYOUICHI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 017732/0186 →