Imaging sensor
View Patent ↗A sensor that is responsive to at least two distinct spectral bands, e.g., infrared radiation and ultraviolet or infrared and visible light makes use of the junction of a diode-based bolometer as a photocell in addition to its temperature dependence for detecting infrared radiation. More specifically the diode bolometer is arranged to work in the conventional manner, in that an electrical characteristic of the diode, e.g., the temperature dependence of its current-voltage (I-V) curve, is used as the basis for measuring temperature, and hence, infrared radiation. Additionally, the same diode may be operated as a photocell to detect radiation that is capable of interacting with the electrons in the junction of the diode. This may be achieved by detecting a change in the operating point of the diode based given its present biasing in response to noninfrared radiation incident upon the diode.
1. A method of operating a diode-based bolometer, the method comprising the steps of:
detecting a change in an electrical characteristic of a diode of said diode-based bolometer in response to infrared radiation incident upon said diode; and
detecting a change in an operating point of said diode in response to noninfrared radiation incident upon said diode.
2. The invention as defined in claim 1 wherein said electrical characteristic is a current-voltage (I-V) curve of said diode.
3. The invention as defined in claim 2 wherein said change in said I-V curve of said diode is caused by a change in temperature of said diode as a result of said infrared radiation being incident upon said diode.
4. The invention as defined in claim 1 wherein said change in said operating point of said diode is a result of a photocurrent that is developed in said diode a in response to said noninfrared radiation being incident upon said diode.
5. The invention as defined in claim 1 wherein said step of detecting a change in an operating point of said diode in response to noninfrared radiation being incident upon said diode further comprises the step of operating said diode as a photocell.
6. The invention as defined in claim 1 wherein said step of detecting a change in an operating point of said diode in response to noninfrared radiation being incident upon said diode further comprises the step of measuring a photocurrent that is the result of electron-hole pairs generated in the junction of said diode in response to said noninfrared radiation being incident upon said diode.
7. The invention as defined in claim 1 wherein said step of detecting a change in said electrical characteristic of said diode further comprises the steps of:
measuring said electrical characteristic while biasing said diode using a first bias current; and
measuring said electrical characteristic while biasing said diode using a second bias current that is different from said first bias current.
8. The invention as defined in claim 1 wherein said step of detecting a change in said electrical characteristic of said diode further comprises the steps of:
measuring said electrical characteristic while biasing said diode using a first bias current that forward biases said diode; and
measuring said electrical characteristic while biasing said diode using a second bias current that reverse biases said diode.
9. The invention as defined in claim 1 wherein said step of detecting a change in said electrical characteristic of said diode further comprises the steps of:
measuring said electrical characteristic while biasing said diode using a first bias voltage that forward biases said diode; and
measuring said electrical characteristic while biasing said diode using a second bias voltage tat biases said diode to be nonforward conducting.
10. Apparatus for detecting radiation in the infrared band and in at least one other band, comprising
a diode that is responsive to exhibit a change in an electrical characteristic of said diode in response to infrared radiation incident upon said diode and for supplying electron-hole pairs generated by a photovoltaic effect in a junction of said diode; and
a circuit for determining (i) a magnitude representative of change in an electrical characteristic of said diode exhibited in response to infrared radiation incident upon said diode and (ii) a magnitude representative of a quantity of a photocurrent resulting from electron-hole pairs generated by a photovoltaic effect in said junction of said diode in response to radiation in said other band that is incident upon said diode.
11. The invention as defined in claim 10 further comprising a shutter adapted to selectively pass radiation of one of said infrared band or said other band.
12. The invention as defined in claim 10 wherein said circuit switches between providing a first biasing voltage to said diode and a second biasing voltage to said diode, said first and second biasing voltages being different.
13. The invention as defined in claim 10 wherein said circuit comprises an amplifier for amplifying a voltage drop across said diode.
14. The invention as defined in claim 13 further comprising phase detector coupled to said amplifier.
15. The invention as defined in claim 14 further comprising a low pass filter coupled to said phase detector.
16. A dual-band sensor that provides an indication of incident radiation in a first band and the magnitude of incident radiation in a second, different band, said magnitude of incident radiation in said second band being measured using a photoeffect in the same component used to measure said magnitude of incident radiation in said first band, said magnitude of incident radiation in said first band being measured using an effect other than a photoeffect.
17. The invention as defined in claim 16 wherein said component is a diode.
18. The invention as defined in claim 16 wherein said component is a photoconductor.
19. The invention as defined in claim 16 wherein said effect other than a photoeffect is a temperature dependence effect.
20. The invention as defined in claim 16 wherein said effect other than a photoeffect is a temperature dependence effect of said component's current-voltage (I-V) curve.