MEMS Fabry Perot filter for integrated spectroscopy system
View Patent ↗Integrated spectroscopy systems are disclosed. In some examples, integrated tunable detectors, using one or multiple Fabry-Perot tunable filters, are provided. Other examples use integrated tunable sources. The tunable source combines one or multiple diodes, such as superluminescent light emitting diodes (SLED), and a Fabry Perot tunable filter or etalon. The advantages associated with the use of the tunable etalon are that it can be small, relatively low power consumption device. For example, newer microelectrical mechanical system (MEMS) implementations of these devices make them the size of a chip. This increases their robustness and also their performance. In some examples, an isolator, amplifier, and/or reference system is further provided integrated.
1. A tunable light source spectroscopy system, comprising:
an optical bench;
a semiconductor source chip bonded to the optical bench;
a Fabry Perot filter system comprising a filter including a MEMS tunable movable mirror die and a fixed mirror substrate, which is bonded to the optical bench, the optical emission from the chip being directed through the filter to produce a tunable signal that is tunable over a scan band of the spectroscopy system;
an output lens, on the optical bench, for coupling the tunable signal to a sample;
a detector, on the optical bench, for detecting light returning from the sample;
an input lens for coupling light from the sample, including light generated by the tunable signal, to the detector; and
a hermetic package in which the optical bench is installed.
2. A system as claimed in claim 1 , wherein the fixed mirror substrate extends below a bottom of the MEMS mirror die for attachment to the optical bench.
3. A system as claimed in claim 1 , wherein the MEMS mirror die is separated from the optical bench and supported by the fixed mirror substrate.
4. A system as claimed in claim 1 , wherein the semiconductor source chip is an edge-emitting chip.
5. A system as claimed in claim 4 , wherein the source chip comprises a semiconductor optical amplifier.
6. A system as claimed in claim 1 , further comprising a thermoelectric cooler for controlling a temperature of the detector and semiconductor source chip.
7. A system as claimed in claim 1 , further comprising a thermoelectric cooler in the hermetic package for controlling a temperature of the detector and semiconductor source chip.