Grating spectrometer system and method for the acquisition of measured values
View Patent ↗The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.
1. A grating spectrometer system comprising:
a light source that illuminates a sample to be analyzed;
a diffraction grating that receives illumination reflected off of the sample from the light source;
imaging optical elements;
a detector arranged in the image plane that receives images of a plurality of diffraction orders from the diffraction grating simultaneously; and
a controlling and regulating unit;
wherein said light source comprises at least two individual light sources having different spectral characteristics whose spectral range, after being diffracted by the diffraction grating, covers a plurality of diffraction orders which are imaged on the detector in the image plane; and
wherein only those individual light sources which do not illuminate the same location of the detector arranged in the image plane in any diffraction order are switched on in groups by the controlling and regulating unit.
2. The grating spectrometer system according to claim 1 ;
wherein the diffraction grating is constructed in such a way that no imaging optical elements are located between the diffraction grating and the detector.
3. The grating spectrometer system according to claim 1 ;
wherein the detector is constructed as an array detector or matrix detector for implementing a polychromator spectrometer arrangement.
4. The grating spectrometer system according to claim 1 ;
wherein one or more individual detectors which are moved in the image plane at the same time are used for implementing a monochromator spectrometer arrangement.
5. The grating spectrometer system according to claim 4 ;
wherein two individual detectors which are moved in the image plane at the same time are used in the monochromator spectrometer arrangement, the distance between the two individual detectors corresponding to one half of the length of the image plane.
6. The grating spectrometer system according to claim 1 ;
wherein LEDs having different spectral characteristics are used as individual light sources.
7. A method for the acquisition of measured values in a grating spectrometer system comprising a light source that illuminates a sample to be analyzed, a diffraction grating that receives illumination reflected off of the sample from the light source, imaging optical elements, a detector arranged in the image plane that receives images of a plurality of diffraction orders from the diffraction grating simultaneously, and a controlling and regulating unit, said method comprising:
the step of irradiating a sample by a light source comprising at least two individual light sources having different spectral characteristics whose spectral range, after being diffracted by the diffraction grating, covers a plurality of diffraction orders which are imaged on the detector in the image plane;
the step of splitting the light of the individual light sources reflected by the sample by the diffraction grating and then imaged in a plurality of diffraction orders on the detector arranged in the image plane; and
the step of switching on the individual light sources which do not illuminate the same location of the detector in any diffraction order in groups by the controlling and regulating unit.
8. The method according to claim 7 , further comprising:
the step of constructing the diffraction grating in such a way that no imaging optical elements are located between the diffraction grating and the detector.
9. The method according to claim 7 , further comprising:
the step of constructing the detector as an array detector or matrix detector for implementing a polychromator spectrometer arrangement.
10. The method according to claim 7 , further comprising:
the step of moving one or more individual detectors in the image plane at the same time for implementing a monochromator spectrometer arrangement.
11. The method according to claim 10 ;
wherein two individual detectors which are moved in the image plane at the same time are used in the monochromator spectrometer arrangement; and
wherein it is provided that the distance between the two individual detectors corresponds to one half of the length of the image plane.
12. The method according to claim 7 ;
wherein LEDs with different spectral characteristics are used as individual light sources.