IP Library Granted Patent US 7,524,700
Granted Patent B2
US 7,524,700 · App. 11/386,019 · Granted Apr 28, 2009

Method for manufacturing semiconductor device, and method and structure for implementing semicondutor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,524,700
App. No.
11/386,019
Granted
Apr 28, 2009
Kind
B2
Abstract

A method for manufacturing a semiconductor device includes forming an electrode; forming a projection projecting with respect to the electrode by melting a resin; and providing a conductive layer electrically connected to the electrode. The conductive layer is extended to an upper surface of the projection. Therefore, productivity of the semiconductor is improved.

Claims (19)

1. A method for implementing a semiconductor device, the semiconductor device including an electrode, a projection that is formed of a first resin and projects with respect to the electrode, and a conductive layer that is electrically connected to the electrode and covers an upper surface of the projection, the method comprising:

preparing a second resin having a curing temperature which is lower than a glass transition temperature of the first resin by no less than 30 degrees Celsius; and

implementing the semiconductor device on a mounting substrate with a joint material formed of the second resin arranged between the semiconductor device and the mounting substrate through heating and pressurization.

2. The method according to claim 1 , wherein the projection has a semicircular cross-sectional shape.

3. The method according to claim 1 , wherein the first resin has a glass transition temperature which is not less than 270 degrees Celsius.

4. The method according to claim 1 , wherein the first resin is phenol resin or polyimide resin.

5. The method according to claim 1 , wherein the second resin is epoxy resin.

6. The method according to claim 1 ,

wherein the electrode is one of a plurality of adjacently arranged electrodes,

wherein the projection is formed to straddle the electrodes,

wherein the conductive layer is one of a plurality of conductive layers that are provided on an upper surface of the projection in correspondence with the electrodes, and

wherein each of the conductive layers is electrically connected to a corresponding one of the electrodes.

7. The method according to claim 1 , wherein the joint material is a non-conductive joint material.

8. A method for implementing a semiconductor device on a mounting substrate, comprising:

forming a projection that projects with respect to an electrode provided in the semiconductor device using a first resin;

providing a conductive layer that is electrically connected to the electrode and covers the projection;

forming a joint material using a second resin having a curing temperature which is lower than a glass transition temperature of the first resin by no less than 30 degrees Celsius;

arranging the joint material between the semiconductor device and the mounting substrate; and

performing heating and pressurization on the joint material, the semiconductor device, and the mounting substrate with the joint material located between the semiconductor device and the mounting substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2020
From: SEIKO EPSON CORPORATION
To: 138 EAST LCD ADVANCEMENTS LIMITED
Reel/Frame 051707/0399 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2006
From: TANAKA, SHUICHI
To: SEIKO EPSON CORPORATION
Reel/Frame 017726/0395 →