IP Library Granted Patent US 8,034,175
Granted Patent B2
US 8,034,175 · App. 11/389,079 · Granted Oct 11, 2011

Apparatus and method for manufacturing semiconductor device, and electronic apparatus

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Quick Facts
Patent No.
US 8,034,175
App. No.
11/389,079
Granted
Oct 11, 2011
Kind
B2
Abstract

A method for manufacturing a semiconductor device, comprises providing a semiconductor layer deposited on a substrate with heat treatment by using a flame of a gas burner fueled by a hydrogen-and-oxygen mixed gas as a heat source.

Claims (16)

1. A semiconductor manufacturing apparatus, comprising:

a water tank that stores water;

an electrolytic tank in which the water is decomposed into a hydrogen-and-oxygen mixed gas by an electric current;

a gas burner that combusts the hydrogen-and-oxygen mixed gas to provide a linear flame,

the gas burner including a rotatable air duct that introduces the mixed gas, the rotatable air duct rotating about its central lengthwise axis and including gas outlets positioned along a length of the rotatable air duct,

wherein the gas outlets are disposed in a spiral manner along the length of the air duct around the central lengthwise axis of the air duct;

a shield that includes a combustion chamber that surrounds the air duct and where the mixed gas combusts, and a nozzle that has a linear opening and emits a combustion gas;

a gas controller that adds a gas to the mixed gas to regulate a mixing ratio of the mixed gas; and

a moving mechanism that moves a semiconductor substrate relative to the flame of the gas burner in a direction perpendicular to the flame;

wherein the air duct having a portion defining a plurality of openings at regular intervals and being moved forward and backward or rotated.

2. The semiconductor manufacturing apparatus according to claim 1 , the air duct being moved forward and backward toward a nozzle in a shield.

3. The semiconductor manufacturing apparatus according to claim 1 , the gas controller emitting a relatively hydrogen rich mixed gas to recrystallize a semiconductor film deposited on the semiconductor substrate.

4. The semiconductor manufacturing apparatus according to claim 1 , the gas controller emitting a relatively oxygen rich mixed gas to provide a gate insulation film deposited on the semiconductor substrate with heat treatment.

5. The semiconductor manufacturing apparatus according to claim 1 , the gas controller adding an inert gas to the mixed gas to regulate a temperature of the flame.

6. The semiconductor manufacturing apparatus according to claim 1 , further comprising:

a heater that heats the semiconductor substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2018
From: SEIKO EPSON CORPORATION
To: 138 EAST LCD ADVANCEMENTS LIMITED
Reel/Frame 046153/0397 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 27, 2006
From: UTSUNOMIYA, SUMIO; SATO, MITSURU
To: SEIKO EPSON CORPORATION
Reel/Frame 017727/0741 →