IP Library Granted Patent US 7,394,544
Granted Patent B2
US 7,394,544 · App. 11/389,714 · Granted Jul 1, 2008

Elution test method and apparatus

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Quick Facts
Patent No.
US 7,394,544
App. No.
11/389,714
Granted
Jul 1, 2008
Kind
B2
Abstract

An elution test method measures the elution process of a specific component in a process where a preparation containing at least the specific component subject to a change with time in chemical properties after elution and an impurity component not subject to a change with time in chemical properties after elution is eluted into a test liquid. The method obtains a ratio of absorbance k of the impurity component and a ratio of absorbance k′ of the specific component at two isosbestic point wavelengths λ 1, λ2 in a spectrum including the specific component and its decomposed matter, and calculates at least one of the absorbances A 1 (t), A 2 (t) of said specific component by using k×C 2 (t)−C 1 (t)=k×A 2 (t)−A 1 (t) and A 1 (t)/A 2 (t)=k′ from the absorbance C 1 (t), C 2 (t) at said two isosbestic point wavelengths λ 1, λ2 measured at the plural time points t in the elution process of said preparation, and converts the result to an elution concentration.

Claims (15)

1. A method for measuring an elution process of a specific component in a process where a preparation containing at least the specific component subject to a change with time in chemical properties after elution and an impurity component not subject to a change with time in chemical properties after elution is eluted into a test liquid, said method comprising:

obtaining a ratio of absorbance k of said impurity component and a ratio of absorbance k′ of said specific component at two isosbestic point wavelengths λ 1 , λ 2 in a system including said specific component and its decomposed matter;

measuring at each time the absorbance C 1 (t), C 2 (t) in said two isosbestic point wavelengths for said test liquid at plural time points t of the elution process of said preparation and calculating at least one of the absorbances A 1 (t), A 2 (t) of said specific component by using the relations: k×C 2 (t)−C 1 (t)=k×A 2 (t)−A 1 (t) and A 1 (t)/A 2 (t)=k′; and

converting the result to an elution concentration.

2. The elution test method according to claim 1 , wherein said two isosbestic point wavelengths have been obtained based on a differential value of absorbance.

3. The elution test method according to claim 2 , wherein said differential value is a first-order differential value, a second-order differential value, or a third-order differential value.

4. An elution test apparatus comprising:

an elution tester for eluting a preparation to be measured into a test liquid;

a detector for irradiating light onto an eluate from the elution tester and measuring an absorbance at two isosbestic point wavelengths λ 1 , λ 2 in a system including a specific component and its decomposed matter contained in the preparation to be measured; and

an arithmetic operation part for calculating at least one of the absorbances A 1 (t), A 2 (t) of said specific component by using

k×C 2( t )− C 1( t )= k×A 2( t )− A 1( t ) and

A 1( t )/ A 2( t )= k′

from the absorbance C 1 (t), C 2 (t) at said two isosbestic point wavelengths λ 1 , λ 2 measured at the plural time points t in the elution process of said preparation, and converting the result to an elution concentration, wherein k represents the ratio of absorbance of said impurity component at said two isosbestic point wavelengths λ 1 , λ 2 and k′ represents the ratio of absorbance of said specific component at said two isosbestic point wavelengths λ 1 , λ 2 .

5. The elution test apparatus according to claim 4 , further comprising:

a reference liquid storage container for storing a reference liquid used to correct the spectrum baseline.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2017
From: EISAI R&D MANAGEMENT CO., LTD.
To: SHIMADZU CORPORATION
Reel/Frame 043224/0292 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2006
From: EISAI CO., LTD.
To: EISAI R&D MANAGEMENT CO., LTD.
Reel/Frame 018491/0993 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2006
From: IWATA, YOSUKE; MORI, MOTOAKI; ASAKAWA, NAOKI
To: SHIMADZU CORPORATION; EISAI CO., LTD.
Reel/Frame 018479/0406 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2006
From: IWATA, YOSUKE; MORI, MOTOAKI; ASAKAWA, NAOKI
To: SHIMADZU CORPORATION; EIZAI CO., LTD.
Reel/Frame 017419/0149 →