IP Library Granted Patent US 7,402,788
Granted Patent B2
US 7,402,788 · App. 11/395,057 · Granted Jul 22, 2008

Detector diodes with bias control loop

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Quick Facts
Patent No.
US 7,402,788
App. No.
11/395,057
Granted
Jul 22, 2008
Kind
B2
Abstract

Methods and devices provide for a dynamic bias voltage control in detector photodiodes. The methods and systems use a bias control loop to make continuous detections of changes in the effective breakdown current of the detector photodiodes, thereby enabling the devices to change the bias voltage as needed. In one embodiment, a sense diode is added and operated at the breakdown current while the detector diode is operated at a small offset from the breakdown current. As performance conditions change, a feedback loop with the sense diode detects changes in the breakdown current and is used to adjust the bias voltage as necessary. In another embodiment, no sense diode is used. Rather, the detector diode itself is maintained at the breakdown current by a low frequency feedback loop. The optical signal is measured by a high frequency filter.

Claims (42)

1. A method for biasing a detector diode, comprising:

using a feedback loop that senses the current output from a sense diode,

maintaining a bias voltage at the sense diode that is sufficient to bring the sense diode close to or into its breakdown state; and

using information from the feedback loop to apply the bias voltage with some offset to a detector diode, whereby the sense diode is at close to or into its breakdown state and wherein the detector diode is not in the breakdown state due to the offset;

wherein maintaining a bias voltage at the sense diode that is sufficient to bring the sense diode close to or into its breakdown state comprises:

comparing the current output of the sense diode with a reference current to determine a current error value;

determining a bias voltage adjustment by processing the current error value in a loop filter of the feedback loop; and

adjusting the bias voltage as necessary.

2. A method as defined in claim 1 further comprising:

receiving and detecting a modulated optical signal at the detector diode.

3. A method as defined in claim 1 wherein the offset voltage is less than about 3 volts.

4. A method as defined in claim 1 wherein the offset voltage is less than about 1 volt.

5. A method as defined in claim 1 wherein the detector diode and the sense diode are avalanche photodiodes.

6. A method as defined in claim 1 wherein the sense diode and the detector diode are matched diodes located in close proximity on the same die.

7. A method as defined in claim 1 , wherein the offset voltage is less than about 3 volts.

8. A method as defined in claim 1 , wherein the offset voltage is less than about 1 volt.

9. A method as defined in claim 1 , wherein the detector diode and the sense diode are avalanche photodiodes.

10. A method as defined in claim 1 , wherein the offset voltage is supplied by the input stage of a transimpedance amplifier.

11. A method as defined in claim 1 , wherein the sense diode and the detector diode are matched diodes located in close proximity on the same die.

12. A method for biasing a detector diode, comprising:

using a feedback loop that senses the current output from a sense diode,

maintaining a bias voltage at the sense diode that is sufficient to bring the sense diode close to or into its breakdown state; and

using information from the feedback loop to apply the bias voltage with some offset to a detector diode, whereby the sense diode is at close to or into its breakdown state and wherein the detector diode is not in the breakdown state due to the offset;

wherein the offset voltage is supplied by the input stage of a transimpedance amplifier.

13. An optoelectronic device comprising:

a sense diode;

a detector diode for receiving an optical signal;

a variable voltage bias supply in communication with, and configured for supplying a bias voltage to, the detector diode and the sense diode;

a feedback loop in communication with the sense diode for detecting shifts in the measured current of the sense diode and adjusting the bias voltage as necessary to maintain the sense diode close to or in a breakdown state; and

an offset voltage in communication with the detector diode for offsetting the bias voltage applied to the detector diode such that the detector diode is not in a breakdown state due to the offset voltage

wherein the feedback loop includes a current measurement device, a summer, and a loop filter.

14. An optoelectronic device as defined in claim 13 wherein the feedback loop uses the difference between a measured current output and a reference current to determine the shifts in the measured current of the sense diode.

15. An optoelectronic device as defined in claim 13 wherein the sense diode and the detector diode are avalanche photodiodes.

16. An optoelectronic device, comprising:

a sense diode;

a detector diode for receiving an optical signal;

a variable voltage bias supply in communication with, and configured for supplying a bias voltage to, an anode of the detector diode and an anode of the sense diode;

a current measurement device in communication with the cathode of the sense diode and with a summer;

a loop filter in communication with the summer and with the variable voltage bias supply, the current measurement device, summer and loop filter comprising a feedback loop for detecting shifts in the measured current of the sense diode and adjusting the bias voltage as necessary to maintain the sense diode close to or in a breakdown state; and

an offset voltage in communication with the detector diode for offsetting the bias voltage applied to the detector diode such that the detector diode is not in a breakdown state due to the offset voltage.

17. An optoelectronic device as defined in claim 16 , wherein the feedback loop uses the difference between a measured current output and a reference current to determine the shifts in the measured current of the sense diode.

18. An optoelectronic device as defined in claim 16 , wherein the sense diode and the detector diode are avalanche photodiodes.

Assignments (5)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
SECURITY INTEREST Recorded Jul 1, 2022
From: II-VI INCORPORATED; II-VI DELAWARE, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; PHOTOP TECHNOLOGIES, INC.; COHERENT, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 060562/0254 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2007
From: MCVEY, JAMES D.
To: FINISAR CORPORATION
Reel/Frame 018895/0660 →