Device for measurement and analysis of electrical signals of an integrated circuit component
View Patent ↗According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) ( 1 ), through which signals ( 4, 5, 6 ) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit ( 7,8 ), and wherein the signals may be connected by means of routes located internally in the component from switch points that are not directly accessible, e.g. points inside the chip ( 15 to 20 ) or covered contact points. The device according to the invention is particularly useful for highly integrated semiconductor chips.
1. An integrated circuit, comprising:
a first plurality of externally inaccessible circuit points, said integrated circuit providing a reference signal and electrical signals via one of said first plurality of externally inaccessible circuit points for test purpose;
a second plurality of externally inaccessible circuit points, providing electrical signals to be monitored for test purposes;
a first externally accessible contact;
a second externally accessible contact;
a first multiplexer having an output connected to said first externally accessible contact, and having a plurality of inputs, each of said plurality of inputs being connected to one of said first plurality of circuit points;
a second multiplexer having an output connected to said second externally accessible contact and having a plurality of inputs, each of said plurality of inputs being connected to one of said second plurality of circuit points, permitting external access to said electrical signals; wherein the reference signal applied to said first externally accessible contact is a reference signal allowing a determination of a timing of the electrical signal applied to a second externally accessible contact.