Decoupling capacitance analysis method
View Patent ↗This method for decoupling capacitance analysis improves upon existing techniques to attempt to give a more accurate representation of the power supply fluctuations on a chip while keeping runtime comparable. This method employs the following techniques; a) a method for descending through hierarchy and dividing the design into a variable sized grid; b) an algorithm to determine which grid locations of a design don't have enough decoupling capacitors for all of the devices in that grid location; c) an algorithm to determine which grid locations are subject to harmful neighboring effects; and d) a method to display the results of the calculations in a graphical manor to allow easy identification of problem areas.
1. A method of measuring neighboring effects in an integrated chip design comprising the steps of:
determining thresholds for identifying significant voltage droop and in the process evaluating decoupling capacitance in said integrated chip design and the local effects of decoupling capacitors in voltage droop caused by said integrated chip design;
combining charge values for said decoupling capacitors to more easily identify neighboring effects;
counting neighbors below the determined threshold to indicate if a current area could be a victim of neighbor effects; and
adjusting warning thresholds based on the number of neighbors below a determined threshold for a given area.