IP Library Granted Patent US 7,876,793
Granted Patent B2
US 7,876,793 · App. 11/411,129 · Granted Jan 25, 2011

Micro free electron laser (FEL)

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Quick Facts
Patent No.
US 7,876,793
App. No.
11/411,129
Granted
Jan 25, 2011
Kind
B2
Abstract

A charged particle beam including charged particles (e.g., electrons) is generated from a charged particle source (e.g., a cathode or scanning electron beam). As the beam is projected, it passes between plural alternating electric fields. The attraction of the charged particles to their oppositely charged fields accelerates the charged particles, thereby increasing their velocities in the corresponding (positive or negative) direction. The charged particles therefore follow an oscillating trajectory. When the electric fields are selected to produce oscillating trajectories having the same (or nearly the same) frequency as the emitted radiation, the resulting photons can be made to constructively interfere with each other to produce a coherent radiation source.

Claims (28)

1. A charged particle accelerating structure comprising:

a series of alternating electric fields along an intended path;

a pre-bunching element; and

a source of charged particles configured to transmit charged particles through the pre-bunching element and through the series of alternating electric fields, wherein the charged particles travel along an oscillating trajectory having a wavelength close to that of radiation emitted from the charged particles during oscillation and wherein the radiation emitted from the charged particles undergoes constructive interference, wherein at least one of the alternating electric fields is created using a resonant structure configured to induce electromagnetic radiation at a frequency higher than a microwave frequency, wherein the resonant structure resonates and creates the at least one of the electric fields when the charged particles pass by the resonant structure.

2. The structure as claimed in claim 1 , wherein the series of alternating accelerations are in a direction substantially perpendicular to the intended path.

3. The structure as claimed in claim 1 , wherein the charged particles comprise electrons.

4. The structure as claimed in claim 1 , wherein the charged particles comprise positively charged ions.

5. The structure as claimed in claim 1 , wherein the charged particles comprise negatively charged ions.

6. The structure as claimed in claim 1 , wherein the series of alternating electric fields comprises alternating adjacent electric fields and fields of opposite polarity on opposite sides of the intended path.

7. The structure as claimed in claim 1 , wherein the series of alternating accelerations are in a direction substantially parallel to the intended path.

8. The structure as claimed in claim 1 , wherein the pre-bunching element comprises a resonant structure.

9. The structure as claimed in claim 8 , wherein a period between segments in the resonant structure is between 150 nm and 220 nm.

10. The structure as claimed in claim 1 , further comprising a focusing element.

11. A method of accelerating charged particles, comprising:

generating a beam of charged particles;

providing a series of alternating electric fields along an intended path;

providing a pre-bunching element; and

transmitting the beam of charged particles along the intended path through the pre-bunching element and through the alternating electric fields such that the charged particles undergo a series of alternating accelerations and produce coherent electromagnetic radiation, wherein at least one of the alternating electric fields is created using a resonant structure configured to induce electromagnetic radiation at a frequency higher than a microwave frequency, wherein the resonant structure resonates and creates the at least one of the electric fields when the charged particles pass by the resonant structure.

12. The method as claimed in claim 11 , wherein the series of alternating accelerations are in a direction substantially perpendicular to the intended path.

13. The method as claimed in claim 11 , wherein the charged particles comprise electrons.

14. The method as claimed in claim 11 , wherein the charged particles comprise positively charged ions.

15. The method as claimed in claim 11 , wherein the charged particles comprise negatively charged ions.

16. The method as claimed in claim 1 , wherein the series of alternating electric fields comprises alternating adjacent electric fields and fields of opposite polarity on opposite sides of the intended path.

17. The method as claimed in claim 11 , wherein the series of alternating accelerations are in a direction substantially parallel to the intended path.

18. The method as claimed in claim 11 , wherein the step of pre-bunching comprises passing the beam of charged particles close enough to a resonant structure to cause the resonant structure to resonate.

19. The method as claimed in claim 11 , further comprising focusing the charged particles prior to substantially a center of the alternating electric fields prior to transmitting the beam of charged particles into the alternating electric fields.

20. The structure as claimed in claim 1 , wherein the pre-bunching element comprises a resonant structure comprising a series of metallic segments having a period of 150-220 nm.

21. The method as claimed in claim 11 , wherein the pre-bunching element comprises a resonant structure comprising a series of metallic segments having a period of 150-220 nm.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Oct 9, 2012
From: APPLIED PLASMONICS, INC.
To: ADVANCED PLASMONICS, INC.
Reel/Frame 029095/0525 →
NUNC PRO TUNC ASSIGNMENT Recorded Oct 3, 2012
From: VIRGIN ISLAND MICROSYSTEMS, INC.
To: APPLIED PLASMONICS, INC.
Reel/Frame 029067/0657 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2006
From: GORRELL, JONATHAN; DAVIDSON, MARK; MAINES, MICHAEL E.
To: VIRGIN ISLANDS MICROSYSTEMS, INC.
Reel/Frame 018351/0291 →