IP Library Granted Patent US 7,300,828
Granted Patent B2
US 7,300,828 · App. 11/411,137 · Granted Nov 27, 2007

Method of manufacturing a liquid crystal display device

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Quick Facts
Patent No.
US 7,300,828
App. No.
11/411,137
Granted
Nov 27, 2007
Kind
B2
Abstract

Disclosed is a photoresist film which is formed in a manner of covering at least a source electrode, a source line, a pixel electrode, a drain electrode, a drain line, a semiconductor film and a protective film, and further covering a gate insulting film in their vicinities. Moreover, wet and dry etchings are sequentially performed by using the photoresist film as a mask. Due to this etching, a residual pattern existing on the gate insulating film is etched.

Claims (64)

1. A method of manufacturing a liquid crystal display device which holds a liquid crystal layer between an active matrix substrate and a counter substrate, the method comprising the steps of:

forming an insulating film above the active matrix substrate;

forming a plurality of conductive patterns on the insulating film by patterning a conductive film formed on the insulating film;

forming a photoresist film which has an outline shape that corresponds to an outline shape of the plurality of conductive patterns and covers at least the plurality of conductive patterns, and which photoresist film additionally contacts and covers the insulating film in vicinities immediately adjacent the covered conductive patterns, and which photoresist film overlays portions of conductive residual patterns extending across the conductive patterns; and

etching portions of the residual patterns which are not covered by the photoresist film, are outside the outline shape of the photoresist film, and exist above the active matrix substrate by using the photoresist film as a mask.

2. The method of manufacturing a liquid crystal display device according to claim 1 , further comprising the steps of, after removing the photoresist film:

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

3. The method of manufacturing a liquid crystal display device according to claim 1 , wherein in the etching with use of the photoresist film as a mask, a surface of the insulating film in areas where the photoresist film does not cover is etched, thus forming a recessed portion adjacent the outline of the photoresist film.

4. The method of manufacturing a liquid crystal display device according to claim 3 , further comprising the steps of, after removing the photoresist film,

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

5. The method of manufacturing a liquid crystal display device according to claim 3 , wherein

said forming a plurality of conductive patterns step forms a semiconductor film with a channel region of a thin film transistor formed between a gate insulating film, and source and drain electrodes, and

said etching step comprises a first etching step in which residual patterns of the conductive pattern are removed, and a second etching step in which residual patterns of the semiconductor film are removed, are sequentially performed by using the photoresist film as a mask.

6. The method of manufacturing a liquid crystal display device according to claim 1 , wherein the etching with use of the photoresist film as a mask is an etching in which wet and dry etchings are used in sequence.

7. The method of manufacturing a liquid crystal display device according to claim 6 , further comprising the steps of, after removing the photoresist film:

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

8. The method of manufacturing a liquid crystal display device according to claim 6 , wherein, in the etching with use of the photoresist film as a mask, a surface of the insulating film in areas where the photoresist film does not cover is etched, thus forming a recessed portion adjacent the outline of the photoresist film.

9. The method of manufacturing a liquid crystal display device according to claim 8 , further comprising the steps of, after removing the photoresist film:

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode in the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

10. The method of manufacturing a liquid crystal display device according to claim 8 , wherein

a semiconductor film, a channel region of a thin film transistor between a gate insulating film, and source and drain electrodes are formed, and

said etching step comprises a first etching, in which first residual patterns of the conductive pattern are removed, and a second etching, in which second residual patterns of the semiconductor film are removed, are sequentially performed by using the photoresist film as a mask, the first residual patterns being located at first locations at a first level and the second residual patterns being located, at second locations at a second level deeper than the first level.

11. The method of manufacturing a liquid crystal display device according to claim 1 , wherein

the insulating film is a gate insulating film, and

the conductive pattern is a source electrode and a drain electrode and a drain line, which is formed on the gate insulating film.

12. The method of manufacturing a liquid crystal display device according to claim 11 , wherein

a semiconductor film, a channel region of a thin film transistor between the gate insulating film, and the source and drain electrodes are formed, and

said etching step comprises a first etching, in which first residual patterns of the conductive pattern are removed, and a second etching, in which second residual patterns of the semiconductor film are removed, are sequentially performed by using the photoresist film as a mask, and the first residual patterns being located at first locations at a first level and the second residual patterns being located at second locations at a second level deeper than the first location level.

13. The method of manufacturing a liquid crystal display device according to claim 11 , wherein, in the etching with use of the photoresist film as a mask, a surface of the insulating film in areas where the photoresist film does not cover is etched, thus forming a recessed portion adjacent the outline of the photoresist film.

14. The method of manufacturing a liquid crystal display device according to claim 13 , further comprising the steps of, after removing the photoresist film,

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

15. The method of manufacturing a liquid crystal display device according to claim 13 , wherein

a semiconductor film, a channel region of a thin film transistor between the gate insulating film, and the source and drain electrodes are formed, and

said etching step comprises a first etching, in which residual patterns of the conductive pattern are removed, and a second etching, in which residual patterns of the semiconductor film are removed, are sequentially performed by using the photoresist film as a mask.

16. The method of manufacturing a liquid crystal display device according to claim 11 , wherein the etching with use of the photoresist film as a mask is an etching in which wet and dry etchings are used in sequence, the wet etching followed by the dry etching.

17. The method of manufacturing a liquid crystal display device according to claim 16 , further comprising the steps of, after removing the photoresist film,

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

18. The method of manufacturing a liquid crystal display device according to claim 16 , wherein, in the etching with use of the photoresist film as a mask, a surface of the insulating film in areas where the photoresist film does not cover is etched, thus forming a recessed portion adjacent the outline of the photoresist film.

19. The method of manufacturing a liquid crystal display device according to claim 18 , further comprising the steps of, after removing the photoresist film,

forming an interlayer insulating film which covers the insulating film and the conductive pattern;

forming a contact hole which extends to the conductive pattern in the interlayer insulating film; and

forming a pixel electrode on the interlayer insulating film and electrically connecting the pixel electrode to the conductive pattern via the contact hole.

20. The method of manufacturing a liquid crystal display device according to claim 18 , wherein

a semiconductor film, a channel region of a thin film transistor between the gate insulating film, and the source and drain electrodes are formed, and

said etching step comprises a first etching, in which residual patterns of the conductive pattern are removed, and a second etching, in which residual patterns of the semiconductor film are removed, are sequentially performed by using the photoresist film as a mask.

21. A method of manufacturing a liquid crystal display device which holds a liquid crystal layer between an active matrix substrate and a counter substrate, the method comprising the steps of:

forming an insulating film in contact with the active matrix substrate;

forming plural conductive patterns contacting the insulating film and contacting the substrate, the conductive patterns being elements of a thin film transistor;

forming a photoresist film with a perimeter outlining an outline shape of the plural conductive patterns, the photoresist film contacting and covering at least the conductive patterns contacting the insulating film, the photoresist film additionally contacting and covering the insulating film in vicinities immediately adjacent the covered conductive patterns, and the photoresist film overlaying portions of conductive residual patterns extending across pairs of adjacent conductive patterns; and

etching portions of the insulating film and portions of the residual patterns not covered by the photoresist film that are outside the outline shape of the photoresist film and exist above the active matrix substrate by using the photoresist film as a mask, wherein,

said etching step results in the insulating film in the vicinities immediately adjacent the covered conductive patterns having a greater thickness than the portions of the insulating film not covered by the photoresist film, and

said etching step removes first residual patterns and second residual patterns, the first residual patterns being located at first locations at a first level and the second residual patterns being located at second locations at a second level deeper than the first level.

Assignments (5)
CHANGE OF NAME Recorded Apr 3, 2014
From: CHIMEI INNOLUX CORPORATION
To: INNOLUX CORPORATION
Reel/Frame 032604/0487 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME AND ADDRESS OF THE RECEIVING PARTY PREVIOUSLY RECORDED ON REEL 025302 AND FRAME 0783 ON NOVEMBER 9, 2010 Recorded May 18, 2011
From: NEC CORPORATION
To: CHIMEI INNOLUX CORPORATION
Reel/Frame 026296/0825 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2010
From: NEC CORPORATION
To: CHIMEI INNLOLUX CORPORATION
Reel/Frame 025302/0783 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2010
From: NEC LCD TECHNOLOGIES, LTD.
To: NEC CORPORATION
Reel/Frame 024492/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2006
From: MOTOSHIMA, HIDETO; SHIMODOZONO, HISANOBU; NISHIMOTO, JUNJI; HORINOUCHI, MAKOTO; SONOHATA, SHOUICHI
To: NEC LCD TECHNOLOGIES, LTD.
Reel/Frame 017816/0098 →