IP Library Granted Patent US 7,417,262
Granted Patent B2
US 7,417,262 · App. 11/415,445 · Granted Aug 26, 2008

Waveguide integrated circuit

Assignee: STMicroelectronics S.A.
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Quick Facts
Patent No.
US 7,417,262
App. No.
11/415,445
Granted
Aug 26, 2008
Kind
B2
Abstract

An integrated circuit includes many metallization levels. A thick dielectric region is placed above at least two metallization levels and laterally neighboring two or more metallization levels. That part of the two metallization levels which lie beneath the dielectric region forms a screen. A conducting strip is placed on the dielectric region so that the dielectric region forms a waveguide.

Claims (33)

1. An integrated circuit, comprising:

a plurality of metallization levels and of dielectric layers, one metallization level being placed between two dielectric layers;

a thick dielectric region placed above at least two of the metallization levels and laterally neighboring others of the metallization levels and filled with a dielectric material, a part of the two metallization levels which lies beneath the thick dielectric region forming a screen; and

a conducting strip placed within the dielectric region and supported by the dielectric material filling so that the dielectric region forms a waveguide.

2. The integrated circuit according to claim 1 , in which said part of the two metallization levels which lies beneath the dielectric region is grounded.

3. The integrated circuit according to claim 1 , in which a plurality of vias are placed between said two metallization levels which lie beneath the dielectric region.

4. The integrated circuit according to claim 1 , in which the others of the metallization levels laterally neighboring the dielectric region are grounded.

5. The integrated circuit according to claim 4 , in which a plurality of vias are placed between said others of the metallization levels laterally neighboring the dielectric region.

6. The integrated circuit according to claim 1 , in which each individual one of the two metallization levels which lies beneath the dielectric region comprises a plurality of similar metal elements connected to one another in rows and columns.

7. The integrated circuit according to claim 1 , in which each individual one of the others of the metallization levels laterally neighboring the dielectric region comprises a plurality of similar metal elements connected to one another in rows and columns.

8. The integrated circuit according to claim 1 , in which said part of the two metallization levels which lies beneath the dielectric region comprises metal elements providing a complete overlap.

9. The integrated circuit according to claim 1 , in which the dielectric region extends parallel to the conducting strip and has a width of more than three times a width of the conducting strip.

10. The integrated circuit according to claim 1 , in which the dielectric region extends parallel to the conducting strip and has a width of at least one times a height of said thick dielectric region.

11. The integrated circuit according to claim 1 , in which the dielectric region is placed laterally neighboring at least four metallization levels.

12. The integrated circuit according to claim 1 , in which the conducting strip comprises a single metal strip element.

13. The integrated circuit according to claim 1 , in which the conducting strip comprises at least two equipotential superposed strip elements based on different materials.

14. An integrated circuit, comprising:

a plurality of stacked and insulator separated metallization levels including first and second groups of plural metallization levels wherein a trench is formed through the second group of metallization levels;

a plurality of vias electrically interconnecting the plurality of metallization levels;

a thick dielectric material filling the trench;

a conducting strip placed within and supported by the thick dielectric material and extending along a length of the trench to form a waveguide.

15. The circuit of claim 14 wherein the conducting strip comprises first and second overlying strip elements.

16. The circuit of claim 15 wherein the first and second overlying strip elements directly contact each other.

17. The circuit of claim 15 wherein the first and second overlying strip elements are separated by dielectric and are electrically interconnected by vias.

18. The circuit of claim 15 wherein the first and second overlying strip elements are separated by a dielectric material.

19. The circuit of claim 15 wherein each individual one of the first group of plural metallization levels is formed from a plurality of adjacent tile segments, each tile segment having a generally square shape with rectangular recesses on each side.

20. The circuit of claim 15 wherein each individual one of the second group of plural metallization levels is formed from a plurality of adjacent tile segments, each tile segment having a generally square shape with a generally square recess in a center thereof.

21. An integrated circuit, comprising:

a first group of insulator separated metallization levels, wherein each level is formed by adjacent first tiles, each first tile having a generally square shape with rectangular recesses on each side;

a second group of insulator separated metallization levels, overlying the first group of insulator separated metallization levels, wherein each level is formed by adjacent second tiles, each second tile having a generally square shape with a generally square recess in a center thereof;

a dielectric region filling a trench formed in the second group of insulator separated metallization levels; and

a conducting strip narrower than a width of the trench, placed within the dielectric region and extending along a length of the trench.

22. The integrated circuit of claim 21 wherein the conductive strip and metallization levels form a waveguide.

Assignments (2)
CHANGE OF NAME Recorded Feb 23, 2024
From: STMICROELECTRONICS SA
To: STMICROELECTRONICS FRANCE
Reel/Frame 066663/0136 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2006
From: PRUVOST, SEBASTIEN; ROUX, JOCELYN
To: STMICROELECTRONICS S.A.
Reel/Frame 018139/0325 →
Priority Claims (1)
FR 05 04675 · May 10, 2005 · national
Continuity (1)
Related Publication 20060270210A1 · Nov 30, 2006