Method for coupling out of a magnetic device
A device for determining the state of a magnetic element includes an emitter constructed and adapted to emit a charged particle beam; a bi-state magnetic cell disposed on a path of the particle beam, whereby the particle beam is deflected along a first deflection path when the cell is in a first magnetic state, and the particle beam is deflected along a second deflection path, distinct from the first deflection path, when the cell is in a second magnetic state. At least one ultra-small resonant structure positioned on the deflection paths.
1 . A method comprising:
providing a multi-state magnetic cell;
providing an ultra-small resonant structure;
directing a charged particle beam along a path near the magnetic cell, whereby the particle beam is deflected in a first direction toward the ultra-small resonant structure when the magnetic cell is in a first state, and the particle beam is deflected away from the ultra-small resonant structure when the magnetic cell is in a second state distinct from the first state.
2 . A method as in claim 1 further comprising:
providing a second ultra-small resonant structure, whereby the particle beam is deflected in a second direction toward the second ultra-small resonant structure when the magnetic cell is in the second state.
3 . A method as in claim 1 wherein the ultra-small resonant structure is a light-emitting resonant structure.
4 . A method as in claim 2 wherein the ultra-small resonant structure is a first light-emitting resonant structure and the second ultra-small resonant structure is a second light-emitting resonant structure.
5 . A method as in claim 4 wherein the first light-emitting resonant structure emits light at a first wavelength and the second light-emitting resonant structure emit light at a second wavelength distinct from the first wavelength.
6 . A method as in claim 4 wherein the first light-emitting resonant structure emits light of a first color and the second light-emitting resonant structure emit light of a second color distinct from the first color.
7 . A method comprising:
providing a multi-state magnetic cell;
providing an first ultra-small resonant structure and a second ultra-small resonant structure;
directing a charged particle beam along a path near the magnetic cell, whereby the particle beam is deflected in a first direction toward the first ultra-small resonant structure when the magnetic cell is in a first state, and the particle beam is deflected away from the first ultra-small resonant structure and toward the second ultra-small resonant structure when the magnetic cell is in a second state distinct from the first state.
8 . A method as in claim 7 wherein at least one of the first ultra-small resonant structure and the second ultra small resonant structure is a light-emitting resonant structure.
9 . A method as in claim 7 wherein the first ultra-small resonant structure emits light at a first wavelength and the second ultra-small resonant structure emits light at a second wavelength distinct from the first wavelength.
10 . A method as in claim 7 wherein the first ultra-small resonant structure emits light of a first color and the second ultra-small resonant structure emits light of a second color distinct from the first color.
11 . A method as in claim 1 wherein the ultra-small resonant structure comprises a detector.
12 . A method as in any one of claims 1 - 11 wherein the beam of charged particles comprises particles selected from the group comprising:
positive ions, negative ions, electrons, and protons and the like.
13 . A device comprising:
an emitter constructed and adapted to emit a charged particle beam;
a multi-state magnetic cell disposed on a path of the particle beam, whereby the particle beam is deflected along a first deflection path when the cell is in a first magnetic state, and the particle beam is deflected along a second deflection path, distinct from the first deflection path, when the cell is in a second magnetic state;
a first ultra-small resonant structure positioned on the first deflection path.
14 . A device as in claim 13 further comprising:
a second ultra-small resonant structure positioned on the second deflection path.
15 . A device as in claim 13 wherein the first ultra-small resonant structure comprises a light-emitting structure.
16 . A device as in claim 14 wherein the first ultra-small resonant structure comprises a first light-emitting structure, and the second ultra-small resonant structure comprises a second light-emitting structure.
17 . A device as in claim 16 wherein the first light-emitting resonant structure emits light at a first wavelength and the second light-emitting resonant structure emit light at a second wavelength distinct from the first wavelength.
18 . A device as in claim 16 wherein the first light-emitting resonant structure emits light of a first color and the second light-emitting resonant structure emit light of a second color distinct from the first color.
19 . A device comprising:
an emitter constructed and adapted to emit a charged particle beam;
a multi-state magnetic cell disposed on a path of the particle beam, whereby the particle beam is deflected along a first deflection path when the cell is in a first magnetic state, and the particle beam is deflected along a second deflection path, distinct from the first deflection path, when the cell is in a second magnetic state;
a first ultra-small resonant structure positioned on the first deflection path;
a second ultra-small resonant structure positioned on the second deflection path, wherein the first ultra-small resonant structure comprises a first light-emitting structure, and the second ultra-small resonant structure comprises a second light-emitting structure, and wherein the first light-emitting resonant structure emits light at a first wavelength and the second light-emitting resonant structure emit light at a second wavelength distinct from the first wavelength.
20 . A method of detecting a state of a magnetic device, the device having a first state and a second state, the second state being distinct from the first state, the method comprising:
directing a beam of charged particles near the magnetic device;
detecting deflection in the beam in a first direction, the first direction being indicative of the magnetic device being in the first state.
21 . A method as in claim 20 further comprising:
detecting deflection of the beam in a second direction, distinct from the first direction, the second direction being indicative of the magnetic device being in the second state.
22 . A method as in any one of claims 21 and 22 wherein the states are used to represent a binary zero value and a binary one value.