IP Library Granted Patent US 7,569,836
Granted Patent B2
US 7,569,836 · App. 11/418,129 · Granted Aug 4, 2009

Transmission of data between microchips using a particle beam

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,569,836
App. No.
11/418,129
Granted
Aug 4, 2009
Kind
B2
Abstract

A device includes first and second chips, each chip containing at least one electronic circuit. The second chip has one or more receivers. A deflection mechanism operationally connected to an electronic circuit of the first chip directs a charged particle beam to different ones of the receivers, based, at least in part, on a data signal provided by the electronic circuit.

Claims (37)

1. A method of communicating between a first chip and a second chip, each said chip having at least one microcircuit, the method comprising:

providing information at the second chip for communication to the first chip;

carrying the information in an electric signal in a metal structure;

providing at least one receiver on said first chip; and

encoding the information in the electric signal into a beam of charged particles by passing the beam near the metal structure; and

directing the encoded beam to said at least one receiver on said first chip.

2. A method as in claim 1 wherein the information is recovered from the beam of charged particles at said least one receiver.

3. A method as in claim 1 wherein said beam is directed by being deflected by at least one deflection mechanism.

4. A method as in claim 3 wherein the deflection mechanism and said at least one receiver are on different chips.

5. A method as in claim 3 wherein said at least one deflection mechanism is controlled, at least in part, by said information.

6. A method as in claim 3 wherein said charged particles are selected from the group: electrons, protons, positive ions and negative ions.

7. A method as in claim 3 wherein at least two receivers are provided.

8. A method as in claim 7 wherein at least one of said receivers is operationally connected to a circuit to provide signals representing said data thereto.

9. A method as in claim 8 wherein the circuit is a microcircuit in the first chip.

10. A method as in claim 1 wherein said first and second chips are distinct chips in a multi-chip module (MCM).

11. A method as in claim 3 wherein the deflection mechanism is provided on the second chip and wherein at least two receivers are provided on the first chip, distinct from the second chip, and wherein said beam of charged particles is directed to a first one of said receivers to represent a binary one value of said information, and said beam is directed to a second one of said receivers to represent a binary zero value of said information.

12. A method as in claim 1 further comprising:

causing said beam of charged particles to be modulated according to the information.

13. A method as in claim 12 wherein said beam of charged particles is modulated by one or more of: pulsing, deflecting, and shaping the charged particle beam.

14. A method according to claim 1 , wherein the metal structure is a cavity.

15. A method according to claim 14 , wherein the cavity has opposing metal sidewalls and the beam passes through the cavity near the metal sidewalls.

16. A converter according to claim 15 , wherein the information in the electric signal is encoded into the charged particle beam by bunching charged particles in the beam as the beam passes through the cavity.

17. A signal format converter for inter-chip communications, comprising:

first and second microchips, the first microchip having information for inter-chip communication to the second microchip;

a metal structure carrying the information in an electric signal;

a charged particle beam path at the first microchip for receiving a charged particle beam, wherein the charged particle beam passes in the path near the metal structure to cause the information in the electric signal to be encoded into the charged particle beam; and

a beam director to provide the encoded charged particle beam to the second microchip.

18. A converter as in claim 17 wherein first and second microchips are distinct chips in a multi-chip module (MCM).

19. A converter as in claim 17 further comprising:

a source of charged particles for generating said charged particle beam.

20. A converter as in claim 17 wherein said charged particles are selected from the group: electrons, protons, positive ions and negative ions.

21. A converter as in claim 17 wherein at least two receivers are provided on the second microchip.

22. A converter as in claim 17 wherein said beam of charged particles is modulated according to the information.

23. A converter as in claim 17 wherein at least two receivers are provided on the second microchip, and wherein said beam of charged particles is directed to a first one of said receivers to represent a binary one value of said information, and said beam is directed to a second one of said receivers to represent a binary zero value of said information.

24. A converter according to claim 17 , wherein the metal structure is a cavity.

25. A converter according to claim 24 , wherein the cavity has opposing metal sidewalls and the beam passes through the cavity near the metal sidewalls.

26. A converter according to claim 25 , wherein the information in the electric signal is encoded into the charged particle beam by bunching charged particles in the beam as the beam passes through the cavity.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE TO REMOVE PATENT 7,559,836 WHICH WAS ERRONEOUSLY CITED IN LINE 27 OF SCHEDULE I AND NEEDS TO BE REMOVED AS FILED ON 4/10/2012. PREVIOUSLY RECORDED ON REEL 028022 FRAME 0961. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Apr 25, 2018
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 046011/0827 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT PREVIOUSLY RECORDED AT REEL: 028022 FRAME: 0961. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECTIVE ASSIGNMENT TO CORRECT THE #27 IN SCHEDULE I OF ASSIGNMENT SHOULD BE: TRANSMISSION OF DATA BETWEEN MICROCHIPS USING A PARTICLE BEAM, PAT. NO 7569836.. Recorded Dec 21, 2017
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 044945/0570 →
SECURITY AGREEMENT Recorded Dec 21, 2017
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 044935/0170 →
NUNC PRO TUNC ASSIGNMENT Recorded Oct 9, 2012
From: APPLIED PLASMONICS, INC.
To: ADVANCED PLASMONICS, INC.
Reel/Frame 029095/0525 →
NUNC PRO TUNC ASSIGNMENT Recorded Oct 3, 2012
From: VIRGIN ISLAND MICROSYSTEMS, INC.
To: APPLIED PLASMONICS, INC.
Reel/Frame 029067/0657 →
SECURITY AGREEMENT Recorded Apr 10, 2012
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 028022/0961 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2006
From: GORRELL, JONATHAN
To: VIRGIN ISLAND MICROSYSTEMS, INC.
Reel/Frame 017742/0367 →